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GARCIA GARCIA, HECTOR

PROFESORES TITULARES DE UNIVERSIDAD
Electricidad y Electrónica
GRUPO DE CARACTERIZACIÓN DE MATERIALES Y DISPOSITIVOS ELECTRÓNICOS ( ELECTRONIC MATERIALS AND DEVICES CHARACTERIZATION GROUP, GCME)
 
hecgar@ele.uva.es

Índice H en Web of Science: 14
Índice H en Scopus: 15
 
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[][ PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE52709 , ARE , 2019-08-15 , REC , 0 , 0 , 216 , 0 , CIE , PUB , Control of the set and reset voltage polarity in anti-series and anti-parallel resistive switching structures , MICROELECTRONIC ENGINEERING , null , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE52708 , ARE , 2019-08-15 , REC , 0 , 0 , 216 , 0 , CIE , PUB , Dynamics of set and reset processes on resistive switching memories , MICROELECTRONIC ENGINEERING , null , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE52710 , ARE , 2019-07-15 , REC , 0 , 0 , 215 , 0 , CIE , PUB , Controlling the intermediate conductance states in RRAM devices for synaptic applications , MICROELECTRONIC ENGINEERING , null , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE52711 , ARE , 2018-10-21 , REC , 0 , 0 , 124 , 15 , CIE , PUB , Analysis and control of the intermediate memory states of RRAM devices by means of admittance parameters , JOURNAL OF APPLIED PHYSICS , null , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE40100 , ARE , 2018-09-01 , REC , 5013 , 5018 , 47 , 9 , CIE , PUB , Electrical Characterization of Defects Created by gamma-Radiation in HfO2-Based MIS Structures for RRAM Applications , JOURNAL OF ELECTRONIC MATERIALS , Garcia, H.; Gonzalez, M. B.; Mallol, M. M.; Castan, H.; Duenas, S.; Campabadal, F.; Acero, M. C.; Sambuco Salomone, L.; Faigon, A. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE40101 , ARE , 2018-09-01 , REC , 4993 , 4997 , 47 , 9 , CIE , PUB , Energy Levels of Defects Created in Silicon Supersaturated with Transition Metals , JOURNAL OF ELECTRONIC MATERIALS , Garcia, H.; Castan, H.; Duenas, S.; Garcia-Hemme, E.; Garcia-Hernansaz, R.; Montero, D.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11079 , ARE , 2018-02-07 , PRS , 1 , 6 , 0 , 0 , CIE , PUB , The Role of Defects in the Resistive Switching Behavior of Ta2O5-TiO2-Based Metal¿Insulator¿Metal (MIM) Devices for Memory Applications , JOURNAL OF ELECTRONIC MATERIALS , Duenas, S.; Castan, H.; Garcia, H.; Ossorio, O. G.; Dominguez, L. A.; Seemen, H.; Tamm, A.; Kukli, K.; Aarik, J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11939 , ARE , 2018-01-10 , REC , 119 , 128 , 9 , 0 , CIE , PUB , Atomic layer deposition and properties of ZrO2/Fe2O3 thin films , BEILSTEIN JOURNAL OF NANOTECHNOLOGY , Kalam, Kristjan; Seemen, Helina; Ritslaid, Peeter; Rahn, Mihkel; Tamm, Aile; Kukli, Kaupo; Kasikov, Aarne; Link, Joosep; Stern, Raivo; Duenas, Salvador; Castan, Helena; Garcia, Hector , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3785 , ARE , 2017-09-01 , REC , 1216 , 1219 , 38 , 0 , CIE , PUB , Experimental observation of negative susceptance in HfO2-based RRAM devices , IEEE ELECTRON DEVICE LETTERS , Duenas, S.; Castan, H.; Garcia, H.; Ossorio, Oscar G.; Dominguez, Luis A.; Miranda, E. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3787 , ARE , 2017-06-25 , REC , 26 , 29 , 178 , 0 , CIE , PUB , A physically based model for resistive memories including a detailed temperature and variability description , MICROELECTRONIC ENGINEERING , Gonzalez-Cordero, G.; Gonzalez, M. B.; Garcia, H.; Campabadal, F.; Duenas, S.; Castan, H.; Jimenez-Molinos, F.; Roldan, J. B. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3786 , ARE , 2017-06-25 , REC , 30 , 33 , 178 , 0 , CIE , PUB , Study of the admittance hysteresis cycles in TiN/Ti/HfO2/W-based RRAM devices , MICROELECTRONIC ENGINEERING , Duenas, S.; Castan, H.; Garcia, H.; Miranda, E.; Gonzalez, M. S.; Campabadal, F. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE39977 , ARE , 2017-01-01 , REC , 0 , 0 , 0 , 0 , CIE , PUB , A Physically Based Model to describe Resistive Switching in different RRAM technologies , 2017 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE) , Gonzalez-Cordero, G.; Gonzalez, M. B.; Garcia, H.; Campabadal, F.; Duenas, S.; Castan, H.; Jimenez-Molinos, F.; Roldan, J. B. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE39976 , ARE , 2017-01-01 , REC , 0 , 0 , 0 , 0 , CIE , PUB , Advanced electrical characterization of atomic layer deposited Al2O3 MIS-based structures , 2017 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE) , Garcia, H.; Castan, H.; Duenas, S.; Gonzalez, M. B.; Acero, M. C.; Campabadal, F. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3788 , ARE , 2016-12-01 , REC , 0 , 0 , 11 , 0 , CIE , PUB , Electrical Characterization of Amorphous Silicon MIS-Based Structures for HIT Solar Cell Applications , NANOSCALE RESEARCH LETTERS , Garcia, Hector; Castan, Helena; Duenas, Salvador; Bailon, Luis; Garcia-Hernansanz, Rodrigo; Olea, Javier; del Prado, Alvaro; Martil, Ignacio , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11941 , ARE , 2016-11-18 , REC , 52 , 57 , 2016-Nove , 0 , CIE , PUB , Advances towards 4J lattice-matched including dilute nitride subcell for terrestrial and space applications , 2016 IEEE 43RD PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) , Ochoa, M.; Garcia, I.; Lombardero, I.; Ayllon, L.; Cifuentes, L.; Rey-Stolle, I.; Algora, C.; Johnson, A. D.; Davies, J. I.; Tan, K. H.; Loke, W. K.; Wicaksono, S.; Yoon, S. F.; Ochoa, E.; Gabas, M.; Thomas, T.; Ekins-Daukes, N. J.; Garcia, H.; Castan, H.; Duenas, S.; Estrade, S.; Peiro, F. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3789 , ARE , 2016-05-01 , REC , 1877 , 1883 , 63 , 0 , CIE , PUB , Study from cryogenic to high temperatures of the high- and low-resistance-state currents of ReRAM Ni-HfO2-Si capacitors , IEEE TRANSACTIONS ON ELECTRON DEVICES , Vaca, Cesar; Gonzalez, Mireia B.; Castan, Helena; Garcia, Hector; Duenas, Salvador; Campabadal, Francesca; Miranda, Enrique; Bailon, Luis A. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11942 , ARE , 2016-01-01 , REC , 153 , 165 , 72 , 0 , CIE , PUB , A complete suite of experimental techniques for electrical characterization of conventional and incoming high-k dielectric-based devices , DIELECTRICS FOR NANOSYSTEMS 7: MATERIALS SCIENCE, PROCESSING, RELIABILITY, AND MANUFACTURING , Duenas, S.; Castan, H.; Garcia, H.; Arroval, T.; Tamm, A.; Kukli, K.; Aarik, J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11080 , ARE , 2016-01-01 , REC , 335 , 342 , 72 , 0 , CIE , PUB , Electrical properties and nanoresistive switching of Ni-HfO2-Si capacitors , DIELECTRICS FOR NANOSYSTEMS 7: MATERIALS SCIENCE, PROCESSING, RELIABILITY, AND MANUFACTURING , Garcia, H.; Gonzalez, M. B.; Vaca, C.; Castan, H.; Duenas, S.; Campabadal, F.; Miranda, E.; Bailon, L. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3790 , ARE , 2015-12-30 , REC , 0 , 0 , 118 , 0 , CIE , PUB , A detailed analysis of the energy levels configuration existing in the band gap of supersaturated silicon with titanium for photovoltaic applications , JOURNAL OF APPLIED PHYSICS , Perez, E.; Duenas, S.; Castan, H.; Garcia, H.; Bailon, L.; Montero, D.; Garcia-Hernansanz, R.; Garcia-Hemme, E.; Olea, J.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3791 , ARE , 2015-11-01 , REC , 55 , 58 , 147 , 0 , CIE , PUB , Charge and current hysteresis in dysprosium-doped zirconium oxide thin films , MICROELECTRONIC ENGINEERING , Castan, H.; Duenas, S.; Garcia, H.; Bailon, L.; Kukli, K.; Tamm, A.; Kozlova, J.; Aarik, J.; Mizohata, K. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3792 , ARE , 2015-05-01 , REC , 0 , 0 , 33 , 0 , CIE , PUB , Hole trap distribution on 2 MeV electron irradiated high-k dielectrics , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Duenas, Salvador; Castan, Helena; Garcia, Hector; Maria Fuentes, Lisa; Bailon, Luis; Campabadal, Francesca; Marc Rafi, Joan; Bargallo Gonzalez, Mireia; Takakura, Kenitirou; Tsunoda, Isao; Yoneoka, Masashi , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3793 , ARE , 2015-03-01 , REC , 0 , 0 , 30 , 0 , CIE , PUB , Characterization of deep level defects present in mono-like, quasi-mono and multicrystalline silicon solar substrates , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Perez, E.; Garcia, H.; Castan, H.; Duenas, S. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3794 , ARE , 2015-03-01 , REC , 0 , 0 , 30 , 0 , CIE , PUB , Scavenging effect on plasma oxidized Gd2O3 grown by high pressure sputtering on Si and InP substrates , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Pampillon, M. A.; Feijoo, P. C.; Andres, E. San; Garcia, H.; Castan, H.; Duenas, S. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3795 , ARE , 2015-01-12 , REC , 0 , 0 , 106 , 0 , CIE , PUB , Energy levels distribution in supersaturated silicon with titanium for photovoltaic applications , APPLIED PHYSICS LETTERS , Perez, E.; Castan, H.; Garcia, H.; Duenas, S.; Bailon, L.; Montero, D.; Garcia-Hernansanz, R.; Garcia-Hemme, E.; Olea, J.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3797 , ARE , 2015-01-01 , REC , 181 , 187 , 21 , 0 , CIE , PUB , Atomic layer deposition and characterization of dysprosium-doped zirconium oxide thin films , CHEMICAL VAPOR DEPOSITION , Tamm, Aile; Kozlova, Jekaterina; Arroval, Tonis; Aarik, Lauri; Ritslaid, Peeter; Garcia, Hector; Castan, Helena; Duenas, Salvador; Kukli, Kaupo; Aarik, Jaan , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3796 , ARE , 2015-01-01 , REC , 55 , 59 , 591 , 0 , CIE , PUB , Conduction and stability of holmium titanium oxide thin films grown by atomic layer deposition , THIN SOLID FILMS , Castan, H.; Garcia, H.; Duenas, S.; Bailon, L.; Miranda, E.; Kukli, K.; Kemell, M.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6958 , ARE , 2015-01-01 , REC , 23 , 0 , 0 , 0 , CIE , PUB , Electrical characterization of MIS capacitors based on Dy2O3-doped ZrO2 dielectrics , PROCEEDINGS OF THE 2015 10TH SPANISH CONFERENCE ON ELECTRON DEVICES (CDE) , Garcia, H.; Castan, H.; Duenas, S.; Perez, E.; Bailon, L.; Tamm, A.; Kukli, K.; Aarik, J.; Mizohata, K. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3799 , ARE , 2014-01-01 , COP , 1707 , 1711 , 54 , 0 , CIE , PUB , Single-parameter model for the post-breakdown conduction characteristics of HoTiOx-based MIM capacitors , MICROELECTRONICS RELIABILITY , Blasco, J.; Castan, H.; Garcia, H.; Duenas, S.; Sune, J.; Kemell, M.; Kukli, K.; Ritala, M.; Leskelae, M.; Miranda, E. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3800 , ARE , 2013-05-10 , REC , 0 , 0 , 28 , 0 , CIE , PUB , Influence of growth and annealing temperatures on the electrical properties of Nb2O5-based MIM capacitors , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Garcia, H.; Castan, H.; Perez, E.; Duenas, S.; Bailon, L.; Blanquart, T.; Niinisto, J.; Kukli, K.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3801 , ARE , 2013-05-01 , REC , 482 , 487 , 534 , 0 , CIE , PUB , 2 MeV electron irradiation effects on bulk and interface of atomic layer deposited high-k gate dielectrics on silicon , THIN SOLID FILMS , Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Campabadal, F.; Rafi, J. M.; Zabala, M.; Beldarrain, O.; Ohyama, H.; Takakura, K.; Tsunoda, I. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3802 , ARE , 2013-01-14 , REC , 0 , 0 , 113 , 0 , CIE , PUB , Experimental verification of intermediate band formation on titanium-implanted silicon , JOURNAL OF APPLIED PHYSICS , Castan, H.; Perez, E.; Garcia, H.; Duenas, S.; Bailon, L.; Olea, J.; Pastor, D.; Garcia-Hemme, E.; Irigoyen, M.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3805 , ARE , 2013-01-01 , REC , 65 , 74 , 79 , 0 , CIE , PUB , 2 MeV electron irradiation effects on the electrical characteristics of metal-oxide-silicon capacitors with atomic layer deposited Al2O 3, HfO2 and nanolaminated dielectrics , SOLID-STATE ELECTRONICS , Rafi, J. M.; Campabadal, F.; Ohyama, H.; Takakura, K.; Tsunoda, I.; Zabala, M.; Beldarrain, O.; Gonzalez, M. B.; Garcia, H.; Castan, H.; Gomez, A.; Duenas, S. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6954 , ARE , 2013-01-01 , REC , 313 , 316 , 0 , 0 , CIE , PUB , Deep level defects on mono-like and polycrystalline silicon solar cells , PROCEEDINGS OF THE 2013 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE 2013) , Perez, E.; Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Moralejo, B.; Martinez, O.; Jimenez, J.; Parra, V. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3804 , ARE , 2013-01-01 , REC , 0 , 0 , 31 , 0 , CIE , PUB , Electrical characterization of atomic-layer-deposited hafnium oxide films from hafnium tetrakis(dimethylamide) and water/ozone: Effects of growth temperature, oxygen source, and postdeposition annealing , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A , Garcia, Hector; Castan, Helena; Duenas, Salvador; Bailon, Luis; Campabadal, Francesca; Beldarrain, Oihane; Zabala, Miguel; Bargallo Gonzalez, Mireia; Marc Rafi, Joan , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6963 , ARE , 2013-01-01 , REC , 285 , 288 , 0 , 0 , CIE , PUB , Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes , PROCEEDINGS OF THE 2013 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE 2013) , Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Feijoo, P. C.; Pampillon, M. A.; San Andres, E. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3803 , ARE , 2013-01-01 , REC , 0 , 0 , 31 , 0 , CIE , PUB , Interface quality of Sc2O3 and Gd2O 3 films based metal-insulator-silicon structures using Al, Pt, and Ti gates: Effect of buffer layers and scavenging electrodes , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Gomez, Alfonso; Castan, Helena; Garcia, Hector; Duenas, Salvador; Bailon, Luis; Angela Pampillon, Maria; Carlos Feijoo, Pedro; San Andres, Enrique , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6952 , ARE , 2013-01-01 , REC , 349 , 352 , 0 , 0 , CIE , PUB , Photocurrent measurements for solar cells characterization , PROCEEDINGS OF THE 2013 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE 2013) , Perez, E.; Maestro, M.; Garcia, H.; Castan, H.; Duenas, S.; Bailon, L. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6953 , ARE , 2013-01-01 , REC , 301 , 304 , 0 , 0 , CIE , PUB , The role of defects in solar cells: Control and detection Defects in solar cells , PROCEEDINGS OF THE 2013 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE 2013) , Duenas, Salvador; Perez, E.; Castan, H.; Garcia, H.; Bailon, L. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6961 , ARE , 2012-01-01 , REC , 189 , 192 , 1496 , 0 , CIE , PUB , Electrical Properties of Intermediate Band (IB) Silicon Solar Cells Obtained by Titanium Ion Implantation , ION IMPLANTATION TECHNOLOGY 2012 , Castan, Helena; Perez, Eduardo; Garcia, Hector; Duenas, Salvador; Bailon, Luis; Olea, Javier; Pastor, David; Garcia-Hemme, Eric; Irigoyen, Maite; Gonzalez-Diaz, German , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3806 , ARE , 2011-01-31 , REC , 2268 , 2272 , 519 , 0 , CIE , PUB , Electrical characterization of high-pressure reactive sputtered ScO x films on silicon , THIN SOLID FILMS , Castan, H.; Duenas, S.; Gomez, A.; Garcia, H.; Bailon, L.; Feijoo, P. C.; Toledano-Luque, M.; del Prado, A.; San Andres, E.; Lucia, M. L. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3808 , ARE , 2011-01-01 , COP , 0 , 0 , 29 , 0 , CIE , PUB , Electrical characteristics of metal-insulator-semiconductor structures with atomic layer deposited Al2 O3, HfO2, and nanolaminates on different silicon substrates , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Campabadal, F.; Rafi, J. M.; Zabala, M.; Beldarrain, O.; Faigon, A.; Castan, H.; Gomez, A.; Garcia, H.; Duenas, S. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3807 , ARE , 2011-01-01 , COP , 0 , 0 , 29 , 0 , CIE , PUB , Electrical characterization of high-k based metal-insulator-semiconductor structures with negative resistance effect when using Al2O 3 and nanolaminated films deposited on p-Si , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Gomez, A.; Castan, H.; Garcia, H.; Duenas, S.; Bailon, L.; Campabadal, F.; Rafi, J. M.; Zabala, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6962 , ARE , 2011-01-01 , REC , 349 , 359 , 41 , 0 , CIE , PUB , Electron Irradiation Effects on Atomic Layer Deposited High-k Gate Dielectrics , PHYSICS AND TECHNOLOGY OF HIGH-K MATERIALS 9 , Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Campabadal, F.; Rafi, J. M.; Zabala, M.; Beldarrain, O.; Ohyama, H.; Takakura, K.; Tsunoda, I. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3809 , ARE , 2011-01-01 , COP , 0 , 0 , 29 , 0 , CIE , PUB , Influence of precursor chemistry and growth temperature on the electrical properties of SrTiO3 -based metal-insulator-metal capacitors grown by atomic layer deposition , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Garcia, H.; Castan, H.; Gomez, A.; Duenas, S.; Bailon, L.; Kukli, K.; Kariniemi, M.; Kemell, M.; Niinisto, J.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3810 , ARE , 2010-06-01 , REC , 0 , 0 , 107 , 0 , CIE , PUB , Effect of interlayer trapping and detrapping on the determination of interface state densities on high-k dielectric stacks , JOURNAL OF APPLIED PHYSICS , Castan, H.; Duenas, S.; Garcia, H.; Gomez, A.; Bailon, L.; Toledano-Luque, M.; del Prado, A.; Martil, I.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6964 , ARE , 2010-01-01 , REC , 287 , 297 , 28 , 0 , CIE , PUB , Electrical characterization of high-pressure reactive sputtered Sc2O3 films on silicon , ADVANCED GATE STACK, SOURCE/DRAIN, AND CHANNEL ENGINEERING FOR SI-BASED CMOS 6: NEW MATERIALS, PROCESSES, AND EQUIPMENT , Castan, H.; Duenas, S.; Gomez, A.; Garcia, H.; Bailon, L.; Feijoo, P. C.; Toledano-Luque, M.; del Prado, A.; San Andres, E.; Lucia, M. L. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3811 , ARE , 2009-07-01 , REC , 1689 , 1691 , 86 , 0 , CIE , PUB , Comparison between the electrical properties of atomic layer deposited thin ZrO2 films processed from cyclopentadienyl precursors , MICROELECTRONIC ENGINEERING , Duenas, Salvador; Castan, Helena; Garcia, Hector; Gomez, Alfonso; Bailon, Luis; Kukli, Kaupo; Niinisto, Jaakko; Ritala, Mikko; Leskela, Markku , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3812 , ARE , 2009-02-19 , REC , 416 , 420 , 27 , 0 , CIE , PUB , Irradiation effect on dielectric properties of hafnium and gadolinium oxide gate dielectrics , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Garcia, H.; Duenas, S.; Castan, H.; Gomez, A.; Bailon, L.; Barquero, R.; Kukli, K.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3813 , ARE , 2009-02-17 , REC , 389 , 393 , 27 , 0 , CIE , PUB , Electrical properties of thin zirconium and hafnium oxide high-k gate dielectrics grown by atomic layer deposition from cyclopentadienyl and ozone precursors , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Duenas, S.; Castan, H.; Garcia, H.; Gomez, A.; Bailon, L.; Kukli, K.; Niinisto, J.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3814 , ARE , 2008-11-25 , REC , 0 , 0 , 104 , 0 , CIE , PUB , Influence of interlayer trapping and detrapping mechanisms on the electrical characterization of hafnium oxide/silicon nitride stacks on silicon , JOURNAL OF APPLIED PHYSICS , Garcia, H.; Duenas, S.; Castan, H.; Gomez, A.; Bailon, L.; Toledano-Luque, M.; del Prado, A.; Martil, I.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3815 , ARE , 2008-10-01 , REC , 0 , 0 , 155 , 0 , CIE , PUB , Comparative study of flatband voltage transients on high-k dielectric-based metal-insulator-semiconductor capacitors , JOURNAL OF THE ELECTROCHEMICAL SOCIETY , Duenas, S.; Castan, H.; Garcia, H.; Gomez, A.; Bailon, L.; Kukli, K.; Aarik, J.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3817 , ARE , 2008-01-15 , REC , 393 , 398 , 354 , 0 , CIE , PUB , Identification of spatial localization and energetic position of electrically active defects in amorphous high-k dielectrics for advanced devices , JOURNAL OF NON-CRYSTALLINE SOLIDS , Garcia, H.; Duenas, S.; Castan, H.; Bailon, L.; Kukli, K.; Aarik, J.; Ritala, M.; Leskelae, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3816 , ARE , 2008-01-15 , REC , 404 , 408 , 354 , 0 , CIE , PUB , Selection of post-growth treatment parameters for atomic layer deposition of structurally disordered TiO2 thin films , JOURNAL OF NON-CRYSTALLINE SOLIDS , Duenas, S.; Castan, H.; Garcia, H.; Bailon, L.; Kukli, K.; Lu, J.; Ritala, M.; Leskelae, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3818 , ARE , 2007-12-01 , REC , 1344 , 1351 , 22 , 0 , CIE , PUB , Electrical properties of high-pressure reactive sputtered thin hafnium oxide high-k gate dielectrics , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Duenas, S.; Castan, H.; Garcia, H.; Gomez, A.; Bailon, L.; Toledano-Luque, M.; Martil, I.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3819 , ARE , 2007-08-31 , REC , 0 , 0 , 154 , 0 , CIE , PUB , Electrical properties of atomic-layer-deposited thin gadolinium oxide high- k gate dielectrics , JOURNAL OF THE ELECTROCHEMICAL SOCIETY , Duenas, S.; Castan, H.; Garcia, H.; Gomez, A.; Bailon, L.; Kukli, K.; Hatanpaeae, T.; Lu, J.; Ritala, M.; Leskelae, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3820 , ARE , 2007-04-01 , REC , 653 , 656 , 47 , 0 , CIE , PUB , Experimental observations of temperature-dependent flat band voltage transients on high-k dielectrics , MICROELECTRONICS RELIABILITY , Dueñas, S.; Castan Lanaspa, Helena; Garcia, L.; Bailon Vega, Luis A.; Kukli, K.; Hatanpapa, T.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3821 , ARE , 2006-11-23 , REC , 0 , 0 , 100 , 0 , CIE , PUB , Experimental investigation of the electrical properties of atomic layer deposited hafnium-rich silicate films on n-type silicon , JOURNAL OF APPLIED PHYSICS , Duenas, S.; Castan, H.; Garcia, H.; Bailon, L.; Kukli, K.; Ritala, M.; Leskela, M.; Rooth, M.; Wilhelmsson, O.; Harsta, A. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3822 , ARE , 2006-03-01 , REC , 0 , 0 , 99 , 0 , CIE , PUB , Influence of single and double deposition temperatures on the interface quality of atomic layer deposited Al2O3 dielectric thin films on silicon , JOURNAL OF APPLIED PHYSICS , Duenas, S; Castan, H; Garcia, H; de Castro, A; Bailon, L; Kukli, K; Aidla, A; Aarik, J; Mandar, H; Uustare, T; Lu, J; Harsta, A , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE8947 , ARE , 2006-01-01 , REC , 123 , 0 , 220 , 0 , CIE , PUB , Disordered structure and density of gap states in high-permittivity thin solid films , DEFECTS IN HIGH-K GATE DIELECTRIC STACKS: NANO-ELECTRONIC SEMICONDUCTOR DEVICES , Kukli, K; Duenas, S; Castan, H; Garcia, H; Barbolla, J; Aarik, J; Aidla, A; Ritala, M; Leskela, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE8946 , ARE , 2006-01-01 , REC , 287 , 0 , 220 , 0 , CIE , PUB , Electrical defects in atomic layer deposited HfO2 films on silicon: Influence of precursor chemistries and substrate treatment , DEFECTS IN HIGH-K GATE DIELECTRIC STACKS: NANO-ELECTRONIC SEMICONDUCTOR DEVICES , Duenas, S; Castan, H; Garcia, H; Bailon, L; Kukli, K; Ritala, M; Leskela, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3823 , ARE , 2005-10-01 , REC , 1044 , 1051 , 20 , 0 , CIE , PUB , A comparative study of the electrical properties of TiO2 films grown by high-pressure reactive sputtering and atomic layer deposition , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Duenas, S; Castan, H; Garcia, H; San Andres, E; Toledano-Luque, M; Martil, I; Gonzalez-Diaz, G; Kukli, K; Uustare, T; Aarik, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3824 , ARE , 2005-05-01 , COP , 949 , 952 , 45 , 0 , CIE , PUB , Electrical characterization of hafnium oxide and hafnium-rich silicate films grown by atomic layer deposition , MICROELECTRONICS RELIABILITY , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Aarik, J; Ritala, M; Leskela, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3825 , ARE , 2005-03-01 , REC , 222 , 229 , 474 , 0 , CIE , PUB , Comparative study on electrical properties of atomic layer deposited high-permittivity materials on silicon substrates , THIN SOLID FILMS , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Ritala, M; Leskela, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE5370 , ARE , 2005-01-01 , REC , 978 , 981 , 45 , 5-6 , CIE , PUB , ON THE INFLUENCE OF SUBSTRATE CLEANING METHOD AND RAPID THERMAL ANNEALING CONDITIONS ON THE ELECTRICAL CHARACTERISTICS OF AL/SINX/SIO2/SI FABRICATED BY ECR-CVD , MICROELECTRONICS RELIABILITY , Duenas, S; Castan, H; Garcia, H; Barbolla, J; San Andres, E; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3826 , ARE , 2004-09-01 , REC , 1141 , 1148 , 19 , 0 , CIE , PUB , The electrical-interface quality of as-grown atomic-layer-deposited disordered HfO2 on p- and n-type silicon , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Aarik, J; Aidla, A , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3827 , ARE , 2004-08-01 , REC , 1365 , 1372 , 96 , 0 , CIE , PUB , Effect of growth temperature and postmetallization annealing on the interface and dielectric quality of atomic layer deposited HfO2 on p and n silicon , JOURNAL OF APPLIED PHYSICS , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Aarik, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6960 , ARE , 2004-01-01 , REC , 147 , 152 , 786 , 0 , CIE , PUB , On the interface quality of MIS structures fabricated from atomic layer deposition of HfO2,Ta2O5 and Nb2O5-Ta2O5-Nb2O5 dielectric thin films , FUNDAMENTALS OF NOVEL OXIDE/SEMICONDUCTOR INTERFACES , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Ritala, M; Leskela, M , S ) ) ) ][ PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1859 , CAP , null , , 313 , 316 , , , , , Deep level defects on mono-like and polycrystalline silicon solar cells , , Perez, E.; Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Moralejo, B.; Martinez, O.; Jimenez, J.; Parra, V. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1865 , CAP , null , , 285 , 288 , , , , , Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes , , Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Feijoo, P. C.; Pampillon, M. A.; San Andres, E. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1857 , CAP , null , , 349 , 352 , , , , , Photocurrent measurements for solar cells characterization , , Perez, E.; Maestro, M.; Garcia, H.; Castan, H.; Duenas, S.; Bailon, L. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1858 , CAP , null , , 301 , 304 , , , , , The role of defects in solar cells: Control and detection Defects in solar cells , , Duenas, Salvador; Perez, E.; Castan, H.; Garcia, H.; Bailon, L. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1864 , CAP , null , , 349 , 359 , , , , , Electron Irradiation Effects on Atomic Layer Deposited High-k Gate Dielectrics , , Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Campabadal, F.; Rafi, J. M.; Zabala, M.; Beldarrain, O.; Ohyama, H.; Takakura, K.; Tsunoda, I. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1066 , CAP , null , , 1 , 4 , , , , , Effect of interlayer trapping and detrapping on the determination of interface state densities on high-k dielectric stacks , , Duenas, S.; Castan, H.; Garcia, H.; Gomez, A.; Bailon, L.; Toledano-Luque, M.; del Prado, A.; Martil, I.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1063 , CAP , null , , 223 , 226 , , , , , Electrical characterization of high-k based MIS capacitors using flat-band voltage transients , , Garcia, H.; Duenas, S.; Castan, H.; Gomez, A.; Bailon, L.; Kukli, K.; Hatanpaa, T.; Aarik, J.; Aidla, A.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1070 , CAP , null , , 227 , 230 , , , , , Electrical characterization of ZrO2-based MIS structures with highly doped Si substrates , , Gomez, A.; Duenas, S.; Castan, H.; Garcia, H.; Bailon, L.; Kukli, K.; Niinisto, J.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1079 , CAP , null , , 8 , 11 , , , , , Study of Atomic Layer Deposited Zirconium Oxide Thin Films by Using Mono-Cyclopentadienyl Based Precursors , , Castan, H.; Duenas, S.; Garcia, H.; Gomez, A.; Bailon, L.; Kukli, K.; Niinisto, J.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP2062 , CAP , null , , 123 , 0 , , , , , Disordered structure and density of gap states in high-permittivity thin solid films , , Kukli, K; Duenas, S; Castan, H; Garcia, H; Barbolla, J; Aarik, J; Aidla, A; Ritala, M; Leskela, M , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP2061 , CAP , null , , 287 , 0 , , , , , Electrical defects in atomic layer deposited HfO2 films on silicon: Influence of precursor chemistries and substrate treatment , , Duenas, S; Castan, H; Garcia, H; Bailon, L; Kukli, K; Ritala, M; Leskela, M , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP2063 , CAP , null , , 29 , 32 , , , , , A comparative study of atomic layer deposited advanced high-k dielectrics , , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Aarik, J; Ritala, M; Leskela, M , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP2064 , CAP , null , , 45 , 48 , , , , , Electrical characterization of atomic-layer-depo sited hafnium silicate for alternative gate dielectric application , , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Ritala, M; Leskela, M , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP2065 , CAP , null , , 49 , 52 , , , , , Interface quality of high-pressure reactive sputtered and atomic layer deposited titanium oxide thin films on silicon , , Duenas, S; Castan, H; Garcia, H; Barbolla, J; San Andres, E; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1863 , CAP , null , , 147 , 152 , , , , , On the interface quality of MIS structures fabricated from atomic layer deposition of HfO2,Ta2O5 and Nb2O5-Ta2O5-Nb2O5 dielectric thin films , , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Ritala, M; Leskela, M , S ) ) ) ][][][][][][][][][][ Tesis ( TES2145637285 , 100 , 2014-11-19 , SC , 58015811 , Universidad de Valladolid , CARACTERIZACIÓN DE DEFECTOS EN MATERIALES SEMICONDUCTORES. APLICACIÓN AL ESTUDIO DE NUEVOS SUSTRATOS DE SILICIO PARA CÉLULAS SOLARES , S , ) ][][][][][][][][com.sigma.investigacion.cawdos.utilidades.CongresoYSusAsociaciones@57c36bd1, com.sigma.investigacion.cawdos.utilidades.CongresoYSusAsociaciones@5edb935a][][][][][][][][][][ Proyecto ( ActivEquipo ( PJI60167 , PJI , TEC2017-84321-C4-2-R , 2018-01-01 , 2020-12-31 , null , 124630 , S , ) ) , Proyecto ( ActivEquipo ( PJI53201 , PJI , TEC2014-52152-C3-3-R , 2015-01-01 , 2018-12-31 , 2018-12-31 , 122694 , S , ) ) , Proyecto ( ActivEquipo ( PJI52089 , PJI , TEC2011-27292-C02-01 , 2012-01-01 , 2015-12-31 , 2015-12-31 , 104544 , S , ) ) , Proyecto ( ActivEquipo ( PJI49698 , PJI , VA128A11-2 , 2011-03-21 , 2013-12-31 , null , 29900 , S , ) ) , Proyecto ( ActivEquipo ( PJI52132 , PJI , TEC2008-06698-C02-02 , 2009-01-01 , 2011-12-31 , null , 205700 , S , ) ) , Proyecto ( ActivEquipo ( PJI48772 , PJI , VA018A06 , 2006-07-26 , 2008-10-31 , null , 18200 , S , ) ) , Proyecto ( ActivEquipo ( PJI49126 , PJI , TEC2005-05101 , 2005-10-15 , 2008-12-31 , null , 152558 , S , ) ) ][][][][]

AYUDA A LA INVESTIGACIÓN

PUBLICACIONES

Artículos de revista (67)

Garcia, H.; Gonzalez, M. B.; Mallol, M. M.; Castan, H.; Duenas, S.; Campabadal, F.; Acero, M. C.; Sambuco Salomone, L.; Faigon, A. Electrical Characterization of Defects Created by gamma-Radiation in HfO2-Based MIS Structures for RRAM Applications. JOURNAL OF ELECTRONIC MATERIALS 2018; 47(9): 5013-5018.
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Capítulos de libros (15)

Perez, E.; Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Moralejo, B.; Martinez, O.; Jimenez, J.; Parra, V. Deep level defects on mono-like and polycrystalline silicon solar cells. En: 2013. p. 313-316.
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Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Feijoo, P. C.; Pampillon, M. A.; San Andres, E. Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes. En: 2013. p. 285-288.
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Perez, E.; Maestro, M.; Garcia, H.; Castan, H.; Duenas, S.; Bailon, L. Photocurrent measurements for solar cells characterization. En: 2013. p. 349-352.
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Duenas, Salvador; Perez, E.; Castan, H.; Garcia, H.; Bailon, L. The role of defects in solar cells: Control and detection Defects in solar cells. En: 2013. p. 301-304.
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Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Campabadal, F.; Rafi, J. M.; Zabala, M.; Beldarrain, O.; Ohyama, H.; Takakura, K.; Tsunoda, I. Electron Irradiation Effects on Atomic Layer Deposited High-k Gate Dielectrics. En: 2011. p. 349-359.
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AYUDA A LA INVESTIGACIÓN

Proyectos (7)

FABRICACIÓN, CARACTERIZACIÓN, SIMULACIÓN, MODELADO Y APLICACIONES DE DISPOSITIVOS DE CONMUTACIÓN RESISTIVA.. CASTAN LANASPA, MARIA HELENA (IP); DUEÑAS CARAZO, SALVADOR (IP); GARCIA GARCIA, HECTOR; SAHELICES FERNANDEZ, BENJAMIN. TEC2017-84321-C4-2-R. FONDOS FEDERMINISTERIO DE ECONOMIA Y COMPETITIVIDAD 2018-2020
CARACTERIZACIÓN ELÉCTRICA DE ESTRUCTURAS MIS Y MIM CON DIELÉCTRICOS DE ALTA PERMITIVIDAD PARA SU APLICACIÓN EN RRAMS Y MEMRISTORES. CASTAN LANASPA, MARIA HELENA (IP); DUEÑAS CARAZO, SALVADOR; VACA RODRIGUEZ, CESAR; GARCIA GARCIA, HECTOR. TEC2014-52152-C3-3-R. MINISTERIO DE ECONOMÍA Y COMPETITIVIDAD 2015-2018
FABRICACIÓN Y CARACTERIZACIÓN DE CAPAS DE DIELÉCTRICOS DE ALTA PERMITIVIDAD DEPOSITADAS POR ALD SOBRE SISLICIO Y SOBRE GRAFENO. CASTAN LANASPA, MARIA HELENA (IP); GOMEZ BRAVO, ALFONSO; GARCIA GARCIA, HECTOR; PEREZ DIEZ, EDUARDO; BAILON VEGA, LUIS ALBERTO; DUEÑAS CARAZO, SALVADOR. TEC2011-27292-C02-01. MICINN. MINISTERIO DE CIENCIA E INNOVACIÓN 2012-2015
CUALIFICACIÓN DE SUSTRATOS DE SILICIO MULTICRISTALINO PARA CÉLULAS SOLARES. CASTAN LANASPA, MARIA HELENA (IP); GOMEZ BRAVO, ALFONSO; GARCIA GARCIA, HECTOR; PEREZ DIEZ, EDUARDO; BAILON VEGA, LUIS ALBERTO; DUEÑAS CARAZO, SALVADOR. VA128A11-2. JCYL CONSEJERÍA DE EDUCACIÓN 2011-2013
CARACTERIZACIÓN ELÉCTRICA DE CAPAS DE DIELECTRICOS DE ALTA PERMITIVIDAD DEPOSITADOS POR ALD. DUEÑAS CARAZO, SALVADOR (IP); GOMEZ BRAVO, ALFONSO; GARCIA GARCIA, HECTOR; BAILON VEGA, LUIS ALBERTO; CASTAN LANASPA, MARIA HELENA; BARQUERO SANZ, MARIA RAQUEL. TEC2008-06698-C02-02. MICINN SECRETARÍA DE ESTADO DE UNIVERSIDADES 2009-2011
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OTROS

Tesis doctorales (1)

PEREZ DIEZ, EDUARDO CARACTERIZACIÓN DE DEFECTOS EN MATERIALES SEMICONDUCTORES. APLICACIÓN AL ESTUDIO DE NUEVOS SUSTRATOS DE SILICIO PARA CÉLULAS SOLARES. UNIVERSIDAD DE VALLADOLID; 2014.
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Congresos (2)

AYUDAS UVA A LA INVESTIGACION: 2014 MRS SPRING MEETING, ( ESTADOS UNIDOS DE AMÉRICA ) 21/04/2014
(Asistencia). GARCIA GARCIA, HECTOR. AYUDAS UVA A LA INVESTIGACION: 2014 MRS SPRING MEETING
Journal of the European Academy of Dermatology and Venereology, 01/01/2003
(Ponencia). Duenas S.; Perez E.; Castan H.; Garcia H.; Bailon L. Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013
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