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JARAIZ MALDONADO, MARTIN

CATEDRATICOS DE UNIVERSIDAD
Electricidad y Electrónica
GRUPO DE ESPECTROSCOPÍA DE PLASMAS Y CHORROS SUPERSÓNICOS
 
mjaraiz@ele.uva.es

Índice H en Web of Science: 20
Índice H en Scopus: 21
 
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[][ PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE50505 , ARE , 2019-11-01 , REC , 13764 , 13779 , 84 , 21 , CIE , PUB , Mimicking Halimane Synthases: Monitoring a Cascade of Cyclizations and Rearrangements from Epoxypolyprenes , Journal of Organic Chemistry , Quilez Del Moral J.; Domingo V.; Perez A.; Martinez Andrade K.; Enriquez L.; Jaraiz M.; Lopez-Perez J.; Barrero A. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE49985 , ARE , 2019-10-03 , REC , 8435 , 8440 , 123 , 39 , CIE , PUB , Rotational Spectrum, Tunneling Motions, and Intramolecular Potential Barriers in Benzyl Mercaptan , Journal of Physical Chemistry A , Saragi R.; Juanes M.; Caminati W.; Lesarri A.; Enriquez L.; Jaraiz M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE50500 , ARE , 2019-06-01 , REC , 4804 , 4809 , 9 , 6 , CIE , PUB , An Efficient Microkinetic Modeling Protocol: Start with Only the Dominant Mechanisms, Adjust All Parameters, and Build the Complete Model Incrementally , ACS CATALYSIS , null , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE50501 , ARE , 2018-05-18 , REC , 5480 , 5495 , 83 , 10 , CIE , PUB , 15-Hydroxygermacranolides as Sources of Structural Diversity: Synthesis of Sesquiterpene Lactones by Cyclization and Rearrangement Reactions. Experimental and DFT Study , JOURNAL OF ORGANIC CHEMISTRY , Alvarez-Calero J.; Ruiz E.; Lopez-Perez J.; Jaraiz M.; Rubio J.; Jorge Z.; Suarez M.; Massanet G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE38483 , ARE , 2018-05-02 , REC , 6564 , 6571 , 24 , 0 , CIE , PUB , Sulfur Hydrogen Bonding in Isolated Monohydrates: Furfuryl Mercaptan versus Furfuryl Alcohol , CHEMISTRY-A EUROPEAN JOURNAL , Juanes M.; Lesarri A.; Pinacho R.; Charro E.; Rubio J.; Enriquez L.; Jaraiz M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7220 , ARE , 2017-07-21 , REC , 17553 , 17559 , 19 , 0 , CIE , PUB , Rotational spectra of tetracyclic quinolizidine alkaloids: does a water molecule flip sparteine? , PHYSICAL CHEMISTRY CHEMICAL PHYSICS , Lesarri A.; Pinacho R.; Enriquez L.; Rubio J.; Jaraiz M.; Abad J.; Gigosos M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7184 , ARE , 2017-04-07 , REC , 3760 , 3766 , 82 , 0 , CIE , PUB , A DFT-Based Computational-Experimental Methodology for Synthetic Chemistry: Example of Application to the Catalytic Opening of Epoxides by Titanocene , JOURNAL OF ORGANIC CHEMISTRY , Jaraiz M.; Enriquez L.; Pinacho R.; Rubio J.; Lesarri A.; Lopez-Perez J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE50506 , ARE , 2016-08-01 , NOT , 0 , 0 , 5 , 8 , CIE , PUB , Cover Picture: Ti-Mediated Efficient Reductive Dehalogenation of Carbon¿Halogen Bonds (Asian J. Org. Chem. 8/2016) , Asian Journal of Organic Chemistry , Gonzalez-Delgado J.; Prieto C.; Enriquez L.; Jaraiz M.; Lopez-Perez J.; Barrero A.; Arteaga J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7775 , ARE , 2016-08-01 , REC , 991 , 1001 , 5 , 0 , CIE , PUB , Ti-Mediated Efficient Reductive Dehalogenation of Carbon-Halogen Bonds , ASIAN JOURNAL OF ORGANIC CHEMISTRY , Gonzalez-Delgado J.; Prieto C.; Enriquez L.; Jaraiz M.; Lopez-Perez J.; Barrero A.; Arteaga J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7777 , ARE , 2015-01-01 , REC , 3462 , 3469 , 13 , 0 , CIE , PUB , Homocoupling versus reduction of radicals: an experimental and theoretical study of Ti(III)-mediated deoxygenation of activated alcohols , ORGANIC & BIOMOLECULAR CHEMISTRY , Prieto, Consuelo; Gonzalez Delgado, Jose A.; Arteaga, Jesus F.; Jaraiz, Martin; Lopez-Perez, Jose L.; Barrero, Alejandro F. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7778 , ARE , 2013-05-01 , REC , 6598 , 6612 , 19 , 0 , CIE , PUB , Structural Diversity from the Transannular Cyclizations of Natural Germacrone and Epoxy Derivatives: A TheoreticalExperimental Study , CHEMISTRY-A EUROPEAN JOURNAL , Perez Morales, M. Carmen; Catalan, Julieta V.; Domingo, Victoriano; Jaraiz, Martin; Mar Herrador, M.; Quilez del Moral, Jose F.; Lopez-Perez, Jose-Luis; Barrero, Alejandro F. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7779 , ARE , 2011-05-15 , REC , 0 , 0 , 109 , 0 , CIE , PUB , Physical modeling and implementation scheme of native defect diffusion and interdiffusion in SiGe heterostructures for atomistic process simulation , JOURNAL OF APPLIED PHYSICS , Castrillo, P.; Pinacho, R.; Jaraiz, M.; Rubio, J. E. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7786 , ARE , 2010-02-26 , REC , 2448 , 2453 , 518 , 0 , CIE , PUB , Atomistic modeling of defect diffusion and interdiffusion in SiGe heterostructures , THIN SOLID FILMS , Castrillo, P.; Jaraiz, M.; Pinacho, R.; Rubio, J. E. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7752 , ARE , 2008-12-05 , REC , 202 , 206 , 154 , 0 , CIE , PUB , Long and double hop kinetic Monte Carlo: Techniques to speed up atomistic modeling without losing accuracy , MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS , Martin-Bragado, Ignacio; Zographos, Nikolas; Jaraiz, Martin , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7767 , ARE , 2008-12-05 , REC , 260 , 263 , 154 , 0 , CIE , PUB , The use of extended-defect dissolution as a probe for stress-induced interstitial diffusion anisotropy , MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS , Castrillo, P.; Pinacho, R.; Jaraiz, M.; Rubioa, J. E.; Singer, J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7768 , ARE , 2008-09-01 , REC , 1430 , 1436 , 52 , 0 , CIE , PUB , From point defects to dislocation loops: A comprehensive modelling framework for self-interstitial defects in silicon , SOLID-STATE ELECTRONICS , Martin-Bragado, Ignacio; Avci, Ibrahim; Zographos, Nikolas; Jaraiz, Martin; Castrillo, Pedro , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7735 , ARE , 2008-01-01 , REC , 229 , 0 , 1070 , 0 , CIE , PUB , Atomistic Simulation and Subsequent Optimization of Boron USJ Using Pre-Amorphization and High Ramp Rates Annealing , DOPING ENGINEERING FOR FRONT-END PROCESSING , Singer, Julien; Wacquant, Francois; Villanueva, Davy; Salvetti, Frederic; Laviron, Cyrille; Cueto, Olga; Rivallin, Pierrette; Jaraiz, Martin; Poncet, Alain , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7771 , ARE , 2008-01-01 , REC , 0 , 0 , 103 , 0 , CIE , PUB , Comprehensive model of damage accumulation in silicon , JOURNAL OF APPLIED PHYSICS , Mok, K. R. C.; Benistant, F.; Jaraiz, M.; Rubio, J. E.; Castrillo, P.; Pincacho, R. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7751 , ARE , 2008-01-01 , REC , 209 , 0 , 1066 , 0 , CIE , PUB , The Role of Implanter Parameters on Implant Damage Generation: an Atomistic Simulation Study , ION IMPLANTATION TECHNOLOGY 2008 , Singer, J.; Jaraiz, M.; Castrillo, P.; Laviron, C.; Cagnat, N.; Wacquant, F.; Cueto, O.; Poncet, A. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE50503 , ARE , 2007-12-01 , REC , 951 , 954 , 0 , 0 , CIE , PUB , Current capabilities and future prospects of atomistic process simulation , TECHNICAL DIGEST: INTERNATIONAL ELECTRON DEVICES MEETING , Jaraiz M.; Castrillo P.; Pinacho R.; Rubio J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7738 , ARE , 2007-09-01 , REC , 2155 , 2163 , 54 , 0 , CIE , PUB , Predictive simulation of advanced Nano-CMOS devices based on kMC process simulation , IEEE TRANSACTIONS ON ELECTRON DEVICES , Mok, K. R. C.; Colombeau, B.; Benistant, F.; Teo, R. S.; Yeong, S. H.; Yang, B.; Jaraiz, M.; Chu, Shao-Fu Sanford , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7760 , ARE , 2007-01-01 , REC , 338 , 0 , 0 , 0 , CIE , PUB , Atomistic modeling and physical comprehension of the effects of implant dose rate on boron activation in pMOSFET S/D , ESSDERC 2007: PROCEEDINGS OF THE 37TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE , Singer, J.; Salvetti, F.; Kaeppelin, V.; Wacquant, F.; Cagnat, N.; Jaraiz, M.; Castrillo, P.; Rubio, E.; Poncet, A. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7766 , ARE , 2007-01-01 , REC , 334 , 0 , 0 , 0 , CIE , PUB , From point defects to dislocation loops: a comprehensive TCAD model for self-interstitial defects in silicon , ESSDERC 2007: PROCEEDINGS OF THE 37TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE , Martin-Bragado, Ignacio; Avci, Ibrahim; Zographos, Nikolas; Castrillo, Pedro; Jaraiz, Martin , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7783 , ARE , 2006-12-01 , REC , 63 , 67 , 253 , 0 , CIE , PUB , Modeling charged defects, dopant diffusion and activation mechanisms for TCAD simulations using kinetic Monte Carlo , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , Martin-Bragado, Ignacio; Tian, S.; Johnson, M.; Castrillo, P.; Pinacho, R.; Rubio, J.; Jaraiz, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE50504 , ARE , 2006-11-21 , REC , 99 , 104 , 912 , 0 , CIE , PUB , Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowth , ADVANCED INTERCONNECTS AND CONTACT MATERIALS AND PROCESSES FOR FUTURE INTEGRATED CIRCUITS , Mok K.; Colombeau B.; Jaraiz M.; Castrillo P.; Rubio J.; Pinacho R.; Srinivasan M.; Benistant F.; Martin-Bragado I.; Hamilton J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE39683 , ARE , 2006-01-01 , REC , 116 , 0 , 0 , 0 , CIE , PUB , Design and optimization of nanoCMOS devices using predictive atomistic physicsbased process modeling , 2006 INTERNATIONAL ELECTRON DEVICES MEETING, VOLS 1 AND 2 , Colombeau, B.; Mok, K. R. C.; Yeong, S. H.; Benistant, F.; Indajang, B.; Tan, O.; Yang, B.; Li, Y.; Jaraiz, M.; Cowem, N. E. B.; Chu, S. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7788 , ARE , 2006-01-01 , REC , 99 , 0 , 912 , 0 , CIE , PUB , Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowthk , DOPING ENGINEERING FOR DEVICE FABRICATION , Mok, K. R. C.; Colombeau, B.; Jaraiz, M.; Castrillo, P.; Rubio, J. E.; Pinacho, R.; Srinivasan, M. P.; Benistant, F.; Martin-Bragado, I.; Hamilton, J. J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7790 , ARE , 2005-12-05 , REC , 389 , 391 , 124 , 0 , CIE , PUB , Bimodal distribution of damage morphology generated by ion implantation , MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY , Mok, KRC; Jaraiz, M; Martin-Bragado, I; Rubio, JE; Castrillo, P; Pinacho, R; Srinivasan, MP; Benistant, F , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7791 , ARE , 2005-12-05 , REC , 383 , 385 , 124 , 0 , CIE , PUB , Comprehensive modeling of ion-implant amorphization in silicon , MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY , Mok, KRC; Jaraiz, M; Martin-Bragadoa, I; Rubio, JE; Castrillo, P; Pinacho, R; Srinivasan, MP; Benistant, F , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7773 , ARE , 2005-12-05 , REC , 392 , 396 , 124 , 0 , CIE , PUB , Dose loss and segregation of boron and arsenic at the Si/SiO2 interface by atomistic kinetic Monte Carlo simulations , MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY , Rubio, JE; Jaraiz, M; Martin-Bragado, I; Castrillo, P; Pinacho, R; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE39684 , ARE , 2005-12-05 , REC , 386 , 388 , 124 , 0 , CIE , PUB , Ion-implant simulations: The effect of defect spatial correlation on damage accumulation , MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY , Mok, KRC; Jaraiz, A; Martin-Bragado, I; Rubio, JE; Castrillo, P; Pinacho, R; Srinivasan, M; Benistant, F , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7772 , ARE , 2005-12-05 , REC , 404 , 408 , 124 , 0 , CIE , PUB , Physically based modeling of dislocation loops in ion implantation processing in silicon , MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY , Castrillo, P; Martin-Bragado, I; Pinacho, R; Jaraiz, M; Rubio, JE; Mok, KRC; Miguel-Herrero, FJ; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7774 , ARE , 2005-09-01 , REC , 0 , 0 , 98 , 0 , CIE , PUB , Fermi-level effects in semiconductor processing: A modeling scheme for atomistic kinetic Monte Carlo simulators , JOURNAL OF APPLIED PHYSICS , Martin-Bragado, I; Castrillo, P; Jaraiz, M; Pinacho, R; Rubio, JE; Barbolla, J; Moroz, V , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7789 , ARE , 2005-08-15 , REC , 0 , 0 , 98 , 0 , CIE , PUB , Ion-beam amorphization of semiconductors: A physical model based on the amorphous pocket population , JOURNAL OF APPLIED PHYSICS , Mok, KRC; Jaraiz, M; Martin-Bragado, I; Rubio, JE; Castrillo, P; Pinacho, R; Barbolla, J; Srinivasan, MP , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7781 , ARE , 2005-07-01 , REC , 0 , 0 , 72 , 0 , CIE , PUB , Physical atomistic kinetic Monte Carlo modeling of Fermi-level effects of species diffusing in silicon , PHYSICAL REVIEW B , Martin-Bragado, I; Castrillo, P; Jaraiz, M; Pinacho, R; Rubio, JE; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7780 , ARE , 2005-06-20 , REC , 0 , 0 , 86 , 0 , CIE , PUB , Modeling arsenic deactivation through arsenic-vacancy clusters using an atomistic kinetic Monte Carlo approach , APPLIED PHYSICS LETTERS , Pinacho, R; Jaraiz, M; Castrillo, P; Martin-Bragado, I; Rubio, JE; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7787 , ARE , 2004-12-15 , REC , 345 , 348 , 114 , 0 , CIE , PUB , A kinetic Monte Carlo annealing assessment of the dominant features from ion implant simulations , MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY , Martin-Bragado, I; Jaraiz, M; Castrillo, P; Pinacho, R; Rubio, JE; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7782 , ARE , 2004-12-15 , REC , 135 , 140 , 114 , 0 , CIE , PUB , Comprehensive, physically based modelling of As in Si , MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY , Pinacho, R; Jaraiz, M; Castrillo, P; Rubio, JE; Martin-Bragado, I; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE39685 , ARE , 2004-12-15 , REC , 284 , 289 , 114 , 0 , CIE , PUB , Physical modeling of Fermi-level effects for decanano device process simulations , MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY , Martin-Bragado, I; Pinacho, R; Castrillo, P; Jaraiz, A; Rubio, JE; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7776 , ARE , 2004-12-15 , REC , 151 , 155 , 114 , 0 , CIE , PUB , Physically based modelling of damage, amorphization, and recrystallization for predictive device-size process simulation , MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY , Rubio, JE; Jaraiz, M; Martin-Bragado, I; Pinacho, R; Castrillo, P; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7733 , ARE , 2004-12-01 , REC , 0 , 0 , 45 , 0 , CIE , PUB , Atomistic modeling and simulation of boron diffusion in crystalline materials: KMC , JOURNAL OF THE KOREAN PHYSICAL SOCIETY , Seo, J; Kwon, O; Kim, K; Won, T; Jaraiz, M; Martin-Bragado, I , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7785 , ARE , 2004-06-14 , REC , 4962 , 4964 , 84 , 0 , CIE , PUB , Ion implant simulations: Kinetic Monte Carlo annealing assessment of the dominant features , APPLIED PHYSICS LETTERS , Martin-Bragado, I; Jaraiz, M; Castrillo, P; Pinacho, R; Rubio, JE; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7769 , ARE , 2003-11-01 , REC , 0 , 0 , 68 , 0 , CIE , PUB , Mobile silicon di-interstitial: Surface, self-interstitial clustering, and transient enhanced diffusion phenomena , PHYSICAL REVIEW B , Martin-Bragado, I; Jaraiz, M; Castrillo, P; Pinacho, R; Barbolla, J; De Souza, MM , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7765 , ARE , 2003-07-01 , REC , 163 , 168 , 94 , 0 , CIE , PUB , Atomistic Monte Carlo simulations of three-dimensional polycrystalline thin films , JOURNAL OF APPLIED PHYSICS , Rubio J.; Jaraiz M.; Martin-Bragado I.; Hernandez-Mangas J.; Barbolla J.; Gilmer G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7755 , ARE , 2003-04-01 , REC , 138 , 142 , 202 , 0 , CIE , PUB , Statistical 3D damage accumulation model for ion implant simulators , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , Hernandez-Mangas J.; Lazaro J.; Enriquez L.; Bailon L.; Barbolla J.; Jaraiz M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7764 , ARE , 2002-09-01 , REC , 1315 , 1324 , 46 , 0 , CIE , PUB , Enhanced modelization of ion implant simulation in compound semiconductors , SOLID-STATE ELECTRONICS , Hernandez-Mangas J.; Enriquez L.; Arias J.; Jaraiz M.; Bailon L. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7784 , ARE , 2002-08-01 , REC , 1582 , 1587 , 92 , 0 , CIE , PUB , Carbon in silicon: Modeling of diffusion and clustering mechanisms , JOURNAL OF APPLIED PHYSICS , Pinacho, R; Castrillo, P; Jaraiz, M; Martin-Bragado, I; Barbolla, J; Gossmann, HJ; Gilmer, GH; Benton, JL , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7747 , ARE , 2002-01-15 , REC , 658 , 667 , 91 , 0 , CIE , PUB , Improved binary collision approximation ion implant simulators , JOURNAL OF APPLIED PHYSICS , Hernandez-Mangas J.; Arias J.; Bailon L.; Jaraiz M.; Barbolla J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE580 , ARE , 2001-06-01 , REC , 12 , 16 , 180 , 0 , CIE , PUB , Atomistic modeling of the effects of dose and implant temperature on dopant diffusion and amorphization in Si , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , Pelaz, L; Marques, LA; Gilmer, GH; Jaraiz, M; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7753 , ARE , 2001-05-01 , REC , 433 , 438 , 174 , 0 , CIE , PUB , Algorithm for statistical noise reduction in three-dimensional ion implant simulations , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , Hernandez-Mangas J.; Arias J.; Jaraiz M.; Bailon L.; Barbolla J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7727 , ARE , 2000-06-01 , REC , 45 , 50 , 25 , 0 , CIE , PUB , Simulation of defects and diffusion phenomena in silicon , MRS BULLETIN , Law, ME; Gilmer, GH; Jaraiz, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7770 , ARE , 2000-03-01 , REC , 59 , 63 , 3 , 0 , CIE , PUB , Kinetic Monte Carlo simulations: an accurate bridge between ab initio calculations and standard process experimental data , MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , Jaraiz, M; Rubio, E; Castrillo, P; Pelaz, L; Bailon, L; Barbolla, J; Gilmer, GH; Rafferty, CS , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7754 , ARE , 1999-12-01 , REC , 369 , 376 , 2 , 0 , CIE , PUB , Cluster ripening and transient enhanced diffusion in silicon , MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , Cowern, NEB; Mannino, G; Stolk, PA; Roozeboom, F; Huizing, HGA; van Berkum, JGM; Cristiano, F; Claverie, A; Jaraiz, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7744 , ARE , 1999-08-02 , REC , 662 , 664 , 75 , 0 , CIE , PUB , Activation and deactivation of implanted B in Si , APPLIED PHYSICS LETTERS , Pelaz, L; Venezia, VC; Gossmann, HJ; Gilmer, GH; Fiory, AT; Rafferty, CS; Jaraiz, M; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7742 , ARE , 1999-06-14 , REC , 3657 , 3659 , 74 , 0 , CIE , PUB , B cluster formation and dissolution in Si: A scenario based on atomistic modeling , APPLIED PHYSICS LETTERS , Pelaz, L; Gilmer, GH; Gossmann, HJ; Rafferty, CS; Jaraiz, M; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7745 , ARE , 1999-05-31 , REC , 4460 , 4463 , 82 , 0 , CIE , PUB , Energetics of self-interstitial clusters in Si , PHYSICAL REVIEW LETTERS , Cowern, NEB; Mannino, G; Stolk, PA; Roozeboom, F; Huizing, HGA; van Berkum, JGM; Cristiano, F; Claverie, A; Jaraiz, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7756 , ARE , 1999-04-05 , REC , 2017 , 2019 , 74 , 0 , CIE , PUB , Modeling of the effects of dose, dose rate, and implant temperature on transient enhanced diffusion , APPLIED PHYSICS LETTERS , Pelaz, L; Gilmer, GH; Venezia, VC; Gossmann, HJ; Jaraiz, M; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7743 , ARE , 1999-01-01 , REC , 163 , 168 , 568 , 0 , CIE , PUB , Ostwald ripening of {113} defects precursors and transient enhanced diffusion , SI FRONT-END PROCESSING-PHYSICS AND TECHNOLOGY OF DOPANT-DEFECT INTERACTIONS , Mannino, G; Cowern, NEB; Stolk, PA; Roozeboom, F; Huizing, HGA; van Berkum, JGM; de Boer, WB; Cristiano, F; Claverie, A; Jaraiz, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7757 , ARE , 1998-09-07 , REC , 1421 , 1423 , 73 , 0 , CIE , PUB , Modeling of the ion mass effect on transient enhanced diffusion: Deviation from the "+1" model , APPLIED PHYSICS LETTERS , Pelaz, L; Gilmer, GH; Jaraiz, M; Herner, SB; Gossmann, HJ; Eaglesham, DJ; Hobler, G; Rafferty, CS; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7746 , ARE , 1998-06-01 , REC , 6182 , 6184 , 83 , 0 , CIE , PUB , Ion mass influence on transient enhanced diffusion and boron clustering in silicon: Deviation from the "+1" model , JOURNAL OF APPLIED PHYSICS , Herner, SB; Gossmann, HJ; Pelaz, LP; Gilmer, GH; Jaraiz, M; Jacobson, DC; Eaglesham, DJ , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7762 , ARE , 1998-01-01 , REC , 43 , 53 , 532 , 0 , CIE , PUB , Atomistic modeling of point and extended defects in crystalline materials , SILICON FRONT-END TECHNOLOGY-MATERIALS PROCESSING AND MODELLING , Jaraiz, M; Pelaz, L; Rubio, E; Barbolla, J; Gilmer, GH; Eaglesham, DJ; Gossmann, HJ; Poate, JM , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7740 , ARE , 1998-01-01 , REC , 127 , 132 , 514 , 0 , CIE , PUB , Monte Carlo atomistic simulation of polycrystalline aluminum deposition , ADVANCED INTERCONNECTS AND CONTACT MATERIALS AND PROCESSES FOR FUTURE INTEGRATED CIRCUITS , Rubio J.; Jaraiz M.; Bailon L.; Barbolla J.; Lopez M.; Gilmer G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE572 , ARE , 1997-11-01 , REC , 893 , 896 , 13 , 0 , CIE , PUB , Molecular dynamics simulations of ion bombardment processes , MATERIALS SCIENCE AND TECHNOLOGY , Marques, LA; Jaraiz, M; Rubio, JE; Vicente, J; Bailon, LA; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7749 , ARE , 1997-05-01 , REC , 6031 , 6050 , 81 , 0 , CIE , PUB , Physical mechanisms of transient enhanced dopant diffusion in ion-implanted silicon , JOURNAL OF APPLIED PHYSICS , Stolk, PA; Gossmann, HJ; Eaglesham, DJ; Jacobson, DC; Rafferty, CS; Gilmer, GH; Jaraiz, M; Poate, JM; Luftman, HS; Haynes, TE , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7748 , ARE , 1997-04-28 , REC , 2285 , 2287 , 70 , 0 , CIE , PUB , B diffusion and clustering in ion implanted Si: The role of B cluster precursors , APPLIED PHYSICS LETTERS , Pelaz, L; Jaraiz, M; Gilmer, GH; Gossmann, HJ; Rafferty, CS; Eaglesham, DJ; Poate, JM , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE571 , ARE , 1997-02-01 , REC , 1488 , 1494 , 81 , 0 , CIE , PUB , Dose effects on amorphous silicon sputtering by argon ions: A molecular dynamics simulation , JOURNAL OF APPLIED PHYSICS , Marques, LA; Rubio, JE; Jaraiz, M; Bailon, LA; Barbolla, JJ , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7750 , ARE , 1997-01-01 , REC , 341 , 346 , 469 , 0 , CIE , PUB , Atomistic model of transient enhanced diffusion and clustering of boron in silicon , DEFECTS AND DIFFUSION IN SILICON PROCESSING , Pelaz, L; Gilmer, GH; Jaraiz, M; Gossmann, HJ; Rafferty, CS; Eaglesham, DJ; Poate, JM , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE591 , ARE , 1996-05-01 , REC , 156 , 159 , 112 , 0 , CIE , PUB , Molecular dynamics study of the fluence dependence of Si sputtering by 1 keV Ar+ ions , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , Rubio, JE; Marques, LA; Pelaz, L; Jaraiz, M; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7729 , ARE , 1996-04-22 , REC , 2395 , 2397 , 68 , 0 , CIE , PUB , Simulation of cluster evaporation and transient enhanced diffusion in silicon , APPLIED PHYSICS LETTERS , Rafferty, CS; Gilmer, GH; Jaraiz, M; Eaglesham, D; Gossmann, HJ , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7730 , ARE , 1996-02-01 , REC , 1 , 7 , 37 , 0 , CIE , PUB , Simulations of thin film deposition from atomic and cluster beams , MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY , Gilmer, GH; Roland, C; Stock, D; Jaraiz, M; delaRubia, T , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7732 , ARE , 1996-01-15 , REC , 409 , 411 , 68 , 0 , CIE , PUB , Atomistic calculations of ion implantation in Si: Point defect and transient enhanced diffusion phenomena , APPLIED PHYSICS LETTERS , Jaraiz, M; Gilmer, GH; Poate, JM; delaRubia, TD , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7741 , ARE , 1996-01-01 , REC , 45 , 50 , 396 , 0 , CIE , PUB , Atomic scale simulations of arsenic ion implantation and annealing in silicon , ION-SOLID INTERACTIONS FOR MATERIALS MODIFICATION AND PROCESSING , Caturla, MJ; DelaRubia, TD; Jaraiz, M; Gilmer, GH , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE587 , ARE , 1995-11-01 , REC , 1191 , 1193 , 11 , 0 , CIE , PUB , Detailed computer simulation of ion implantation processes into crystals , MATERIALS SCIENCE AND TECHNOLOGY , Arias, J; Jaraiz, M; Rubio, JE; Pelaz, L; Marques, LA; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE568 , ARE , 1995-08-01 , REC , 7 , 11 , 102 , 0 , CIE , PUB , AN IMPROVED MOLECULAR-DYNAMICS SCHEME FOR ION-BOMBARDMENT SIMULATIONS , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , Marques L.; Rubio J.; Jaraiz M.; Enriquez L.; Barbolla J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7728 , ARE , 1995-08-01 , REC , 180 , 182 , 102 , 0 , CIE , PUB , DEFECTS FROM IMPLANTATION IN SILICON BY LINKED MARLOWE-MOLECULAR DYNAMICS CALCULATIONS , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , JARAIZ, M; GILMER, GH; STOCK, DM; DELARUBIA, TD , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7731 , ARE , 1995-08-01 , REC , 247 , 255 , 102 , 0 , CIE , PUB , DIFFUSION AND INTERACTIONS OF POINT-DEFECTS IN SILICON - MOLECULAR-DYNAMICS SIMULATIONS , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , GILMER, GH; DELARUBIA, TD; STOCK, DM; JARAIZ, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7759 , ARE , 1995-08-01 , REC , 228 , 231 , 102 , 0 , CIE , PUB , LOW-ENERGY ION-IMPLANTATION SIMULATION USING A MODIFIED BINARY COLLISION APPROXIMATION CODE , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , ARIAS, J; JARAIZ, M; PELAZ, L; BAILON, LA; BARBOLLA, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE570 , ARE , 1995-08-01 , REC , 301 , 304 , 102 , 0 , CIE , PUB , MOLECULAR-DYNAMICS SIMULATION OF AMORPHOUS-SILICON SPUTTERING BY AR+ IONS , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , RUBIO, JE; MARQUEZ, LA; JARAIZ, M; BAILON, LA; BARBOLLA, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7739 , ARE , 1995-08-01 , REC , 207 , 210 , 102 , 0 , CIE , PUB , POINT-DEFECT ACCUMULATION IN SILICON IRRADIATED BY ENERGETIC PARTICLES - A MOLECULAR-DYNAMICS SIMULATION , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , STOCK, DM; GILMER, GH; JARAIZ, M; DELARUBIA, TD , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7761 , ARE , 1994-01-01 , REC , 151 , 156 , 339 , 0 , CIE , PUB , ON THE FORWARD CONDUCTION MECHANISMS IN SIC P-N JUNCTIONS , DIAMOND, SIC AND NITRIDE WIDE BANDGAP SEMICONDUCTORS , PELAZ, L; VINCENTE, J; JARAIZ, M; BAILON, L; BARBOLLA, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7758 , ARE , 1993-06-01 , REC , 172 , 175 , 80-1 , 0 , CIE , PUB , COMPUTER-SIMULATION OF POINT-DEFECT DISTRIBUTIONS GENERATED BY ION-IMPLANTATION , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , JARAIZ, M; ARIAS, J; RUBIO, JE; BAILON, LA; BARBOLLA, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7737 , ARE , 1993-03-01 , REC , 321 , 323 , 44 , 0 , CIE , PUB , DETAILED COMPUTER-SIMULATION OF DAMAGE ACCUMULATION IN ION IRRADIATED CRYSTALLINE TARGETS , VACUUM , JARAIZ, M; ARIAS, J; BAILON, LA; BARBOLLA, JJ , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7734 , ARE , 1992-05-15 , REC , 5136 , 5139 , 71 , 0 , CIE , PUB , INTERWELL ENHANCEMENT OF THE PHOTOLUMINESCENCE EFFICIENCY IN GAAS/ALGAAS QUANTUM-WELLS , JOURNAL OF APPLIED PHYSICS , JARAIZ, M; BAILON, LA; BARBOLLA, JJ , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7763 , ARE , 1991-01-01 , REC , 298 , 301 , 69 , 0 , CIE , PUB , OPTICAL CAPTURE CROSS-SECTIONS OF PALLADIUM IN SILICON , JOURNAL OF APPLIED PHYSICS , RUBIO, E; VICENTE, J; JARAIZ, M; ARIAS, J; BAILON, L; BARBOLLA, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6959 , ARE , 1987-04-01 , REC , 2541 , 2545 , 61 , 0 , CIE , PUB , OPTICAL ADMITTANCE SPECTROSCOPY - A NEW METHOD FOR DEEP LEVEL CHARACTERIZATION , JOURNAL OF APPLIED PHYSICS , DUENAS, S; JARAIZ, M; VICENTE, J; RUBIO, E; BAILON, L; BARBOLLA, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE7736 , ARE , 1986-09-01 , REC , 1895 , 1900 , 133 , 0 , CIE , PUB , A NON-FICKIAN MODEL OF THE BORON IN SILICON DIFFUSION FROM BN SOURCES , JOURNAL OF THE ELECTROCHEMICAL SOCIETY , DOMINGUEZ, E; JARAIZ, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6957 , ARE , 1986-09-01 , REC , 883 , 884 , 29 , 0 , CIE , PUB , ELECTRON THERMAL EMISSION RATES OF NICKEL CENTERS IN SILICON , SOLID-STATE ELECTRONICS , JARAIZ, M; DUENAS, S; VICENTE, J; BAILON, L; BARBOLLA, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE23310 , ARE , 1986-01-01 , REC , 103 , 111 , 0 , 203 , CIE , PUB , Transporte magnético de sólidos , Ingeniería química , Jaraiz, Eladio; Briz, Jose A.; Jaraiz, Martin , S ) ) ) ][ PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1919 , CAP , null , , 229 , 0 , , , , , Atomistic Simulation and Subsequent Optimization of Boron USJ Using Pre-Amorphization and High Ramp Rates Annealing , , Singer, Julien; Wacquant, Francois; Villanueva, Davy; Salvetti, Frederic; Laviron, Cyrille; Cueto, Olga; Rivallin, Pierrette; Jaraiz, Martin; Poncet, Alain , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1926 , CAP , null , , 209 , 0 , , , , , The Role of Implanter Parameters on Implant Damage Generation: an Atomistic Simulation Study , , Singer, J.; Jaraiz, M.; Castrillo, P.; Laviron, C.; Cagnat, N.; Wacquant, F.; Cueto, O.; Poncet, A. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1933 , CAP , null , , 9 , 12 , , , , , Atomistic modeling of defect diffusion in SiGe , , Castrillo, P.; Pinacho, R.; Rubio, J. E.; Vega, L. M.; Jaraiz, M. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1927 , CAP , null , , 338 , 0 , , , , , Atomistic modeling and physical comprehension of the effects of implant dose rate on boron activation in pMOSFET S/D , , Singer, J.; Salvetti, F.; Kaeppelin, V.; Wacquant, F.; Cagnat, N.; Jaraiz, M.; Castrillo, P.; Rubio, E.; Poncet, A. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1930 , CAP , null , , 334 , 0 , , , , , From point defects to dislocation loops: a comprehensive TCAD model for self-interstitial defects in silicon , , Martin-Bragado, Ignacio; Avci, Ibrahim; Zographos, Nikolas; Castrillo, Pedro; Jaraiz, Martin , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1934 , CAP , null , , 99 , 0 , , , , , Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowthk , , Mok, K. R. C.; Colombeau, B.; Jaraiz, M.; Castrillo, P.; Rubio, J. E.; Pinacho, R.; Srinivasan, M. P.; Benistant, F.; Martin-Bragado, I.; Hamilton, J. J. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1918 , CAP , null , , 145 , 0 , , , , , Coupling advanced atomistic process and device modeling for optimizing future CMOS devices , , Colombeau, B.; Yeong, S. H.; Pandey, S. M.; Benistant, F.; Jaraiz, M.; Chu, S. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1916 , CAP , null , , 116 , 0 , , , , , Design and optimization of nanoCMOS devices using predictive atomistic physicsbased process modeling , , Colombeau, B.; Mok, K. R. C.; Yeong, S. H.; Benistant, F.; Indajang, B.; Tan, O.; Yang, B.; Li, Y.; Jaraiz, M.; Cowem, N. E. B.; Chu, S. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1932 , CAP , null , , 951 , 954 , , , , , Current capabilities and future prospects of atomistic process simulation , , Jaraiz, M.; Castrillo, P.; Pinacho, R.; Rubio, J. E. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1915 , CAP , null , , 87 , 90 , , , , , Integrated atomistic process and device simulation of decananometre MOSFETs , , Asenov, A; Jaraiz, M; Roy, S; Roy, G; Adamu-Lema, F; Brown, AR; Moroz, V; Gafiteanu, R , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1920 , CAP , null , , 247 , 250 , , , , , Introducing Monte Carlo diffusion simulation into TCAD tools , , Strecker, Norbert; Moroz, Victor; Jaraiz, Martin , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1931 , CAP , null , , 10 , 17 , , , , , Atomistic front-end process modelling: A powerful tool for deep-submicron device fabrication , , Jaraiz, M; Castrillo, P; Pinacho, R; Martin-Bragado, I; Barbolla, J , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1924 , CAP , null , , 163 , 168 , , , , , Ostwald ripening of {113} defects precursors and transient enhanced diffusion , , Mannino, G; Cowern, NEB; Stolk, PA; Roozeboom, F; Huizing, HGA; van Berkum, JGM; de Boer, WB; Cristiano, F; Claverie, A; Jaraiz, M , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1929 , CAP , null , , 43 , 53 , , , , , Atomistic modeling of point and extended defects in crystalline materials , , Jaraiz, M; Pelaz, L; Rubio, E; Barbolla, J; Gilmer, GH; Eaglesham, DJ; Gossmann, HJ; Poate, JM , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1922 , CAP , null , , 127 , 132 , , , , , Monte Carlo atomistic simulation of polycrystalline aluminum deposition , , Rubio, JE; Jaraiz, M; Bailon, LA; Barbolla, J; Lopez, MJ; Gilmer, GH , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1925 , CAP , null , , 341 , 346 , , , , , Atomistic model of transient enhanced diffusion and clustering of boron in silicon , , Pelaz, L; Gilmer, GH; Jaraiz, M; Gossmann, HJ; Rafferty, CS; Eaglesham, DJ; Poate, JM , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1923 , CAP , null , , 45 , 50 , , , , , Atomic scale simulations of arsenic ion implantation and annealing in silicon , , Caturla, MJ; DelaRubia, TD; Jaraiz, M; Gilmer, GH , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1917 , CAP , null , , 77 , 80 , , , , , Ion implantation and transient enhanced diffusion , , Poate, JM; Eaglesham, DJ; Gilmer, GH; Gossmann, HJ; Jaraiz, M; Rafferty, CS; Stolk, PA , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1928 , CAP , null , , 151 , 156 , , , , , ON THE FORWARD CONDUCTION MECHANISMS IN SIC P-N JUNCTIONS , , PELAZ, L; VINCENTE, J; JARAIZ, M; BAILON, L; BARBOLLA, J , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1921 , CAP , null , , 79 , 82 , , , , , EFFECTS OF NEAR-INTERFACE DEFECTS ON THE OPTICAL-PROPERTIES OF MBE GROWN GAAS/ALGAAS LAYERS , , JARAIZ, M , S ) ) ) ][][][][][][][][][][ Tesis ( TES2145628713 , 100 , 2004-12-03 , SC , 58015811 , Universidad de Valladolid , SIMULACIÓN ATOMÍSTICA DE PROCESOS PARA MICROELECTRÓNICA , S , ) , Tesis ( TES2145627020 , 100 , 1996-01-12 , CL , 58015811 , Universidad de Valladolid , SIMULACIÓN DEL SPUTTERING Y DE LA CRISTALIZACIÓN PRODUCIDOS POR BOMBARDEO IÓNICO EN SILICIO , S , ) ][][][][][][][][com.sigma.investigacion.cawdos.utilidades.CongresoYSusAsociaciones@20189479, com.sigma.investigacion.cawdos.utilidades.CongresoYSusAsociaciones@2dbba465, com.sigma.investigacion.cawdos.utilidades.CongresoYSusAsociaciones@7a25fa57, com.sigma.investigacion.cawdos.utilidades.CongresoYSusAsociaciones@5356a467][][][][][][][][][][ Proyecto ( ActivEquipo ( PJI60291 , PJI , PGC2018-098561-B-C22 , 2019-01-01 , 2021-12-31 , null , 62920 , S , ) ) , Proyecto ( ActivEquipo ( PJI60146 , PJI , VA056G18 , 2018-06-05 , 2020-09-30 , null , 12000 , S , ) ) , Proyecto ( ActivEquipo ( PJI53116 , PJI , CTQ2015-68148-C2-2-P , 2016-01-01 , 2018-12-31 , 2019-06-30 , 67518 , S , ) ) , Proyecto ( ActivEquipo ( PJI52329 , PJI , TEC2008-05301/TEC , 2009-01-01 , 2011-12-31 , null , 69575 , S , ) ) , Proyecto ( ActivEquipo ( PJI49371 , PJI , VA062A08 , 2008-01-01 , 2009-12-31 , null , 12900 , S , ) ) , Proyecto ( ActivEquipo ( PJI56320 , PJI , , 2007-01-01 , 2007-12-31 , null , 900 , S , ) ) , Proyecto ( ActivEquipo ( PJI47496 , PJI , PB98-0348 , 1999-12-30 , 2001-12-30 , null , 134626.7 , S , ) ) , Proyecto ( ActivEquipo ( PJI53844 , PJI , VA27/97 , 1997-04-02 , 1999-04-01 , null , 8330.63 , S , ) ) , Proyecto ( ActivEquipo ( PJI53705 , PJI , VA37/96 , 1997-01-04 , 1999-01-03 , null , 14882.86 , S , ) ) , Proyecto ( ActivEquipo ( PJI53598 , PJI , PB95-0710 , 1996-11-01 , 1999-11-01 , null , 152056.06 , S , ) ) , Proyecto ( ActivEquipo ( PJI53724 , PJI , VA40/93 , 1993-12-29 , 1996-12-28 , null , 8414.17 , S , ) ) , Proyecto ( ActivEquipo ( PJI53618 , PJI , PB92-0264 , 1993-05-31 , 1996-05-30 , null , 26444.53 , S , ) ) ][][][][]

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PUBLICACIONES

Artículos de revista (88)

Quilez Del Moral J.; Domingo V.; Perez A.; Martinez Andrade K.; Enriquez L.; Jaraiz M.; Lopez-Perez J.; Barrero A. Mimicking Halimane Synthases: Monitoring a Cascade of Cyclizations and Rearrangements from Epoxypolyprenes. JOURNAL OF ORGANIC CHEMISTRY 2019; 84(21): 13764-13779.
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Saragi R.; Juanes M.; Caminati W.; Lesarri A.; Enriquez L.; Jaraiz M. Rotational Spectrum, Tunneling Motions, and Intramolecular Potential Barriers in Benzyl Mercaptan. Journal of Physical Chemistry A 2019; 123(39): 8435-8440.
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Alvarez-Calero J.; Ruiz E.; Lopez-Perez J.; Jaraiz M.; Rubio J.; Jorge Z.; Suarez M.; Massanet G. 15-Hydroxygermacranolides as Sources of Structural Diversity: Synthesis of Sesquiterpene Lactones by Cyclization and Rearrangement Reactions. Experimental and DFT Study. JOURNAL OF ORGANIC CHEMISTRY 2018; 83(10): 5480-5495.
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Juanes M.; Lesarri A.; Pinacho R.; Charro E.; Rubio J.; Enriquez L.; Jaraiz M. Sulfur Hydrogen Bonding in Isolated Monohydrates: Furfuryl Mercaptan versus Furfuryl Alcohol. Chemistry - A European Journal 2018; 24: 6564-6571.
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Capítulos de libros (20)

Singer, Julien; Wacquant, Francois; Villanueva, Davy; Salvetti, Frederic; Laviron, Cyrille; Cueto, Olga; Rivallin, Pierrette; Jaraiz, Martin; Poncet, Alain. Atomistic Simulation and Subsequent Optimization of Boron USJ Using Pre-Amorphization and High Ramp Rates Annealing. En: 2008.
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Singer, J.; Jaraiz, M.; Castrillo, P.; Laviron, C.; Cagnat, N.; Wacquant, F.; Cueto, O.; Poncet, A. The Role of Implanter Parameters on Implant Damage Generation: an Atomistic Simulation Study. En: 2008.
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Castrillo, P.; Pinacho, R.; Rubio, J. E.; Vega, L. M.; Jaraiz, M. Atomistic modeling of defect diffusion in SiGe. En: Simulation of Semiconductor Processes and Devices 2007. 2007. p. 9-12.
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Singer, J.; Salvetti, F.; Kaeppelin, V.; Wacquant, F.; Cagnat, N.; Jaraiz, M.; Castrillo, P.; Rubio, E.; Poncet, A. Atomistic modeling and physical comprehension of the effects of implant dose rate on boron activation in pMOSFET S/D. En: 2007.
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Martin-Bragado, Ignacio; Avci, Ibrahim; Zographos, Nikolas; Castrillo, Pedro; Jaraiz, Martin. From point defects to dislocation loops: a comprehensive TCAD model for self-interstitial defects in silicon. En: 2007.
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Proyectos (12)

ESPECTROSCOPÍA Y DINÁMICA EN EXPANSIONES SUPERSÓNICAS: INTERACCIONES NO COVALENTES EN MOLÉCULAS BIOLÓGICAS Y PREBIÓTICAS. JARAIZ MALDONADO, MARTIN (IP); LESARRI GOMEZ, ALBERTO EUGENIO (IP); ENRIQUEZ GIRAUDO, MARIA LOURDES; PINACHO GOMEZ, RUTH; RUBIO GARCIA, JOSE EMILIANO. PGC2018-098561-B-C22. FONDOS FEDERAGENCIA ESTATAL DE INVESTIGACIÓN 2019-2021
ESTUDIOS DE RECONOCIMIENTO Y AUTOENSAMBLADO MOLECULAR MEDIANTE ESPECTROSCOPÍA DE ROTACIÓN Y MODELIZACIÓN COMPUTACIONAL. GIGOSOS PEREZ, MARCO ANTONIO (IP); JARAIZ MALDONADO, MARTIN; LESARRI GOMEZ, ALBERTO EUGENIO. VA056G18. JUNTA DE CASTILLA Y LEÓN -CONSEJERÍA DE EDUCACIÓN 2018-2020
AUTOAGREGACION MOLECULAR: ESPECTROSCOPIA Y DINAMICA DE COMPLEJOS DEBILMENTE ENLAZADOS.. LESARRI GOMEZ, ALBERTO EUGENIO (IP); RUBIO GARCIA, JOSE EMILIANO; ENRIQUEZ GIRAUDO, MARIA LOURDES; JARAIZ MALDONADO, MARTIN; PINACHO GOMEZ, RUTH. CTQ2015-68148-C2-2-P. MINISTERIO DE ECONOMÍA Y COMPETITIVIDAD FONDOS FEDER 2016-2019
MODELOS AVANZADOS DE SIMULACIÓN DE LOS EFECTOS DE LA TENSIÓN MECÁNICA EN LOS PROCESOS DE FABRICACIÓN DE DISPOSITIVOS DE ÚLTIMA GENERACIÓN BASADOS EN SI. CASTRILLO ROMON, PEDRO (IP); RUBIO GARCIA, JOSE EMILIANO; JARAIZ MALDONADO, MARTIN; PINACHO GOMEZ, RUTH. TEC2008-05301/TEC. MICINN SECRETARÍA DE ESTADO DE UNIVERSIDADES 2009-2011
DESARROLLO DE HERRAMIENTAS DE SIMULACIÓN ATOMÍSTICA PARA LA FABRICACIÓN DE DISPOSITIVOS MOSFET DE SIGE Y SI TENSADO. CASTRILLO ROMON, PEDRO (IP); RUBIO GARCIA, JOSE EMILIANO; JARAIZ MALDONADO, MARTIN; PINACHO GOMEZ, RUTH. VA062A08. JUNTA DE CASTILLA Y LEÓN -CONSEJERÍA DE EDUCACIÓN 2008-2009
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Tesis doctorales (2)

MARTIN BRAGADO, IGNACIO SIMULACIÓN ATOMÍSTICA DE PROCESOS PARA MICROELECTRÓNICA. UNIVERSIDAD DE VALLADOLID; 2004.
 
MARQUES CUESTA, LUIS ALBERTO SIMULACIÓN DEL SPUTTERING Y DE LA CRISTALIZACIÓN PRODUCIDOS POR BOMBARDEO IÓNICO EN SILICIO. UNIVERSIDAD DE VALLADOLID; 1996.
 
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Congresos (4)

Technical Digest - International Electron Devices Meeting, IEDM, 10/12/2007 - 12/12/2007
(Ponencia). Jaraiz M.; Castrillo P.; Pinacho R.; Rubio J. Technical Digest - International Electron Devices Meeting, IEDM
Physical Chemistry Chemical Physics, 01/01/2007
(Ponencia). Marques L.; Pelaz L.; Santos I.; Lopez P.; Aboy M. 2007 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2007
Materials Research Society Symposium Proceedings, 18/04/2006 - 19/04/2006
(Ponencia). Mok K.; Colombeau B.; Jaraiz M.; Castrillo P.; Rubio J.; Pinacho R.; Srinivasan M.; Benistant F.; Martin-Bragado I.; Hamilton J. Materials Research Society Symposium Proceedings
Materials Research Society Symposium - Proceedings, 13/04/1998 - 16/04/1998
(Ponencia). Rubio J.; Jaraiz M.; Bailon L.; Barbolla J.; Lopez M.; Gilmer G. Materials Research Society Symposium - Proceedings
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