Inicio > CASTAN LANASPA, MARIA HELENA

CASTAN LANASPA, MARIA HELENA

CATEDRATICOS DE UNIVERSIDAD
Electricidad y Electrónica
GRUPO DE CARACTERIZACIÓN DE MATERIALES Y DISPOSITIVOS ELECTRÓNICOS ( ELECTRONIC MATERIALS AND DEVICES CHARACTERIZATION GROUP, GCME)
 
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[][ PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE40934 , ARE , 2019-01-01 , REC , 294 , 300 , 669 , 0 , CIE , PUB , Electrical and magnetic properties of atomic layer deposited cobalt oxide and zirconium oxide nanolaminates , Thin Solid Films , Kalam K.; Seemen H.; Mikkor M.; Jõgiaas T.; Ritslaid P.; Tamm A.; Kukli K.; Kasikov A.; Link J.; Stern R.; Dueñas S.; Castan H. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE40100 , ARE , 2018-09-01 , REC , 5013 , 5018 , 47 , 9 , CIE , PUB , Electrical Characterization of Defects Created by gamma-Radiation in HfO2-Based MIS Structures for RRAM Applications , JOURNAL OF ELECTRONIC MATERIALS , Garcia, H.; Gonzalez, M. B.; Mallol, M. M.; Castan, H.; Duenas, S.; Campabadal, F.; Acero, M. C.; Sambuco Salomone, L.; Faigon, A. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE40101 , ARE , 2018-09-01 , REC , 4993 , 4997 , 47 , 9 , CIE , PUB , Energy Levels of Defects Created in Silicon Supersaturated with Transition Metals , JOURNAL OF ELECTRONIC MATERIALS , Garcia, H.; Castan, H.; Duenas, S.; Garcia-Hemme, E.; Garcia-Hernansaz, R.; Montero, D.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE40098 , ARE , 2018-08-09 , REC , 0 , 0 , 7 , 9 , CIE , PUB , Electric and Magnetic Properties of Atomic Layer Deposited ZrO2-HfO2 Thin Films , ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , Kalam, Kristjan; Seemen, Helina; Mikkor, Mats; Ritslaid, Peeter; Stern, Raivo; Duenas, Salvador; Castan, Helena; Tamm, Aile; Kukli, Kaupo , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE40099 , ARE , 2018-07-28 , REC , 0 , 0 , 7 , 8 , CIE , PUB , Properties of Atomic Layer Deposited Nanolaminates of Zirconium and Cobalt Oxides , ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , Seemen, Helina; Rahn, Mihkel; Kalam, Kristjan; Sajavaara, Timo; Duenas, Salvador; Castan, Helena; Link, Joosep; Stern, Raivo; Kukli, Kaupo; Tamm, Aile , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11079 , ARE , 2018-02-07 , PRS , 1 , 6 , 0 , 0 , CIE , PUB , The Role of Defects in the Resistive Switching Behavior of Ta2O5-TiO2-Based Metal¿Insulator¿Metal (MIM) Devices for Memory Applications , JOURNAL OF ELECTRONIC MATERIALS , Duenas, S.; Castan, H.; Garcia, H.; Ossorio, O. G.; Dominguez, L. A.; Seemen, H.; Tamm, A.; Kukli, K.; Aarik, J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11075 , ARE , 2018-01-15 , REC , 63 , 70 , 112 , 0 , CIE , PUB , A novel double-layer mucoadhesive tablet containing probiotic strain for vaginal administration: Design, development and technological evaluation , European Journal of Pharmaceutical Sciences , Sanchez M.; Ruiz M.; Castan H.; Morales M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11939 , ARE , 2018-01-10 , REC , 119 , 128 , 9 , 0 , CIE , PUB , Atomic layer deposition and properties of ZrO2/Fe2O3 thin films , BEILSTEIN JOURNAL OF NANOTECHNOLOGY , Kalam, Kristjan; Seemen, Helina; Ritslaid, Peeter; Rahn, Mihkel; Tamm, Aile; Kukli, Kaupo; Kasikov, Aarne; Link, Joosep; Stern, Raivo; Duenas, Salvador; Castan, Helena; Garcia, Hector , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE40102 , ARE , 2018-01-01 , REC , 0 , 0 , 7 , 2 , CIE , PUB , Atomic Layer Deposition of Zirconium Dioxide from Zirconium Tetraiodide and Ozone , ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , Kukli, Kaupo; Kemell, Marianna; Mizohata, Kenichiro; Vehkamaki, Marko; Kalam, Kristjan; Castan, Helena; Duenas, Salvador; Link, Joosep; Stern, Raivo; Ritala, Mikko; Leskela, Markku , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11940 , ARE , 2017-12-01 , REC , 255 , 260 , 42 , 0 , CIE , PUB , Design, development and characterization of transdermal patch of methadone , Journal of Drug Delivery Science and Technology , Muñoz M.; Castan H.; Ruiz M.; Morales M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3785 , ARE , 2017-09-01 , REC , 1216 , 1219 , 38 , 0 , CIE , PUB , Experimental observation of negative susceptance in HfO2-based RRAM devices , IEEE ELECTRON DEVICE LETTERS , Duenas, S.; Castan, H.; Garcia, H.; Ossorio, Oscar G.; Dominguez, Luis A.; Miranda, E. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3787 , ARE , 2017-06-25 , REC , 26 , 29 , 178 , 0 , CIE , PUB , A physically based model for resistive memories including a detailed temperature and variability description , MICROELECTRONIC ENGINEERING , Gonzalez-Cordero, G.; Gonzalez, M. B.; Garcia, H.; Campabadal, F.; Duenas, S.; Castan, H.; Jimenez-Molinos, F.; Roldan, J. B. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3786 , ARE , 2017-06-25 , REC , 30 , 33 , 178 , 0 , CIE , PUB , Study of the admittance hysteresis cycles in TiN/Ti/HfO2/W-based RRAM devices , MICROELECTRONIC ENGINEERING , Duenas, S.; Castan, H.; Garcia, H.; Miranda, E.; Gonzalez, M. S.; Campabadal, F. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE39977 , ARE , 2017-01-01 , REC , 0 , 0 , 0 , 0 , CIE , PUB , A Physically Based Model to describe Resistive Switching in different RRAM technologies , 2017 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE) , Gonzalez-Cordero, G.; Gonzalez, M. B.; Garcia, H.; Campabadal, F.; Duenas, S.; Castan, H.; Jimenez-Molinos, F.; Roldan, J. B. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE39976 , ARE , 2017-01-01 , REC , 0 , 0 , 0 , 0 , CIE , PUB , Advanced electrical characterization of atomic layer deposited Al2O3 MIS-based structures , 2017 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE) , Garcia, H.; Castan, H.; Duenas, S.; Gonzalez, M. B.; Acero, M. C.; Campabadal, F. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE40103 , ARE , 2017-01-01 , REC , 0 , 0 , 6 , 12 , CIE , PUB , Properties of Zirconium Oxide and Cobalt Ferrite Layered Nanocomposite , ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , Tamm, Aile; Joost, Urmas; Mikkor, Mats; Kalam, Kristjan; Mandar, Hugo; Seemen, Helina; Link, Joosep; Stern, Raivo; Castan, Helena; Duenas, Salvador; Kukli, Kaupo , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3788 , ARE , 2016-12-01 , REC , 0 , 0 , 11 , 0 , CIE , PUB , Electrical Characterization of Amorphous Silicon MIS-Based Structures for HIT Solar Cell Applications , NANOSCALE RESEARCH LETTERS , Garcia, Hector; Castan, Helena; Duenas, Salvador; Bailon, Luis; Garcia-Hernansanz, Rodrigo; Olea, Javier; del Prado, Alvaro; Martil, Ignacio , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11941 , ARE , 2016-11-18 , REC , 52 , 57 , 2016-Nove , 0 , CIE , PUB , Advances towards 4J lattice-matched including dilute nitride subcell for terrestrial and space applications , 2016 IEEE 43RD PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC) , Ochoa, M.; Garcia, I.; Lombardero, I.; Ayllon, L.; Cifuentes, L.; Rey-Stolle, I.; Algora, C.; Johnson, A. D.; Davies, J. I.; Tan, K. H.; Loke, W. K.; Wicaksono, S.; Yoon, S. F.; Ochoa, E.; Gabas, M.; Thomas, T.; Ekins-Daukes, N. J.; Garcia, H.; Castan, H.; Duenas, S.; Estrade, S.; Peiro, F. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3789 , ARE , 2016-05-01 , REC , 1877 , 1883 , 63 , 0 , CIE , PUB , Study from cryogenic to high temperatures of the high- and low-resistance-state currents of ReRAM Ni-HfO2-Si capacitors , IEEE TRANSACTIONS ON ELECTRON DEVICES , Vaca, Cesar; Gonzalez, Mireia B.; Castan, Helena; Garcia, Hector; Duenas, Salvador; Campabadal, Francesca; Miranda, Enrique; Bailon, Luis A. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11942 , ARE , 2016-01-01 , REC , 153 , 165 , 72 , 0 , CIE , PUB , A complete suite of experimental techniques for electrical characterization of conventional and incoming high-k dielectric-based devices , DIELECTRICS FOR NANOSYSTEMS 7: MATERIALS SCIENCE, PROCESSING, RELIABILITY, AND MANUFACTURING , Duenas, S.; Castan, H.; Garcia, H.; Arroval, T.; Tamm, A.; Kukli, K.; Aarik, J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11080 , ARE , 2016-01-01 , REC , 335 , 342 , 72 , 0 , CIE , PUB , Electrical properties and nanoresistive switching of Ni-HfO2-Si capacitors , DIELECTRICS FOR NANOSYSTEMS 7: MATERIALS SCIENCE, PROCESSING, RELIABILITY, AND MANUFACTURING , Garcia, H.; Gonzalez, M. B.; Vaca, C.; Castan, H.; Duenas, S.; Campabadal, F.; Miranda, E.; Bailon, L. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE25899 , ARE , 2016-01-01 , REC , 39 , 40 , 0 , 6 , CIE , PUB , Luis Bailón, lección de ciencia y vida , Revista de ciencias , Castan Lanaspa, Helena , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3790 , ARE , 2015-12-30 , REC , 0 , 0 , 118 , 0 , CIE , PUB , A detailed analysis of the energy levels configuration existing in the band gap of supersaturated silicon with titanium for photovoltaic applications , JOURNAL OF APPLIED PHYSICS , Perez, E.; Duenas, S.; Castan, H.; Garcia, H.; Bailon, L.; Montero, D.; Garcia-Hernansanz, R.; Garcia-Hemme, E.; Olea, J.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3791 , ARE , 2015-11-01 , REC , 55 , 58 , 147 , 0 , CIE , PUB , Charge and current hysteresis in dysprosium-doped zirconium oxide thin films , MICROELECTRONIC ENGINEERING , Castan, H.; Duenas, S.; Garcia, H.; Bailon, L.; Kukli, K.; Tamm, A.; Kozlova, J.; Aarik, J.; Mizohata, K. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3792 , ARE , 2015-05-01 , REC , 0 , 0 , 33 , 0 , CIE , PUB , Hole trap distribution on 2 MeV electron irradiated high-k dielectrics , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Duenas, Salvador; Castan, Helena; Garcia, Hector; Maria Fuentes, Lisa; Bailon, Luis; Campabadal, Francesca; Marc Rafi, Joan; Bargallo Gonzalez, Mireia; Takakura, Kenitirou; Tsunoda, Isao; Yoneoka, Masashi , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3793 , ARE , 2015-03-01 , REC , 0 , 0 , 30 , 0 , CIE , PUB , Characterization of deep level defects present in mono-like, quasi-mono and multicrystalline silicon solar substrates , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Perez, E.; Garcia, H.; Castan, H.; Duenas, S. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3794 , ARE , 2015-03-01 , REC , 0 , 0 , 30 , 0 , CIE , PUB , Scavenging effect on plasma oxidized Gd2O3 grown by high pressure sputtering on Si and InP substrates , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Pampillon, M. A.; Feijoo, P. C.; Andres, E. San; Garcia, H.; Castan, H.; Duenas, S. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3795 , ARE , 2015-01-12 , REC , 0 , 0 , 106 , 0 , CIE , PUB , Energy levels distribution in supersaturated silicon with titanium for photovoltaic applications , APPLIED PHYSICS LETTERS , Perez, E.; Castan, H.; Garcia, H.; Duenas, S.; Bailon, L.; Montero, D.; Garcia-Hernansanz, R.; Garcia-Hemme, E.; Olea, J.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3797 , ARE , 2015-01-01 , REC , 181 , 187 , 21 , 0 , CIE , PUB , Atomic layer deposition and characterization of dysprosium-doped zirconium oxide thin films , CHEMICAL VAPOR DEPOSITION , Tamm, Aile; Kozlova, Jekaterina; Arroval, Tonis; Aarik, Lauri; Ritslaid, Peeter; Garcia, Hector; Castan, Helena; Duenas, Salvador; Kukli, Kaupo; Aarik, Jaan , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3796 , ARE , 2015-01-01 , REC , 55 , 59 , 591 , 0 , CIE , PUB , Conduction and stability of holmium titanium oxide thin films grown by atomic layer deposition , THIN SOLID FILMS , Castan, H.; Garcia, H.; Duenas, S.; Bailon, L.; Miranda, E.; Kukli, K.; Kemell, M.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11943 , ARE , 2015-01-01 , REC , 869 , 876 , 22 , 0 , CIE , PUB , Design, development and characterization of buccal bioadhesive films of Doxepin for treatment of odontalgia , Drug Delivery , Castan H.; Ruiz M.; Clares B.; Morales M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6958 , ARE , 2015-01-01 , REC , 23 , 0 , 0 , 0 , CIE , PUB , Electrical characterization of MIS capacitors based on Dy2O3-doped ZrO2 dielectrics , PROCEEDINGS OF THE 2015 10TH SPANISH CONFERENCE ON ELECTRON DEVICES (CDE) , Garcia, H.; Castan, H.; Duenas, S.; Perez, E.; Bailon, L.; Tamm, A.; Kukli, K.; Aarik, J.; Mizohata, K. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3798 , ARE , 2014-06-05 , REC , 84 , 89 , 467 , 0 , CIE , PUB , Obtaining fast dissolving disintegrating tablets with different doses of melatonin , International Journal of Pharmaceutics , Muñoz H.; Castan H.; Clares B.; Ruiz M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11081 , ARE , 2014-01-01 , REC , 0 , 0 , 1691 , 0 , CIE , PUB , Resistive switching behavior and electrical properties of TiO2:Ho2O3 and HoTiOx Based MIM Capacitors , SILICON FRONT-END JUNCTION FORMATION-PHYSICS AND TECHNOLOGY , Garcia H.; Castan H.; Dueñas S.; Perez E.; Bailon L.; Kukli K.; Ritala M.; Leskela M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3799 , ARE , 2014-01-01 , COP , 1707 , 1711 , 54 , 0 , CIE , PUB , Single-parameter model for the post-breakdown conduction characteristics of HoTiOx-based MIM capacitors , MICROELECTRONICS RELIABILITY , Blasco, J.; Castan, H.; Garcia, H.; Duenas, S.; Sune, J.; Kemell, M.; Kukli, K.; Ritala, M.; Leskelae, M.; Miranda, E. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3800 , ARE , 2013-05-10 , REC , 0 , 0 , 28 , 0 , CIE , PUB , Influence of growth and annealing temperatures on the electrical properties of Nb2O5-based MIM capacitors , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Garcia, H.; Castan, H.; Perez, E.; Duenas, S.; Bailon, L.; Blanquart, T.; Niinisto, J.; Kukli, K.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3801 , ARE , 2013-05-01 , REC , 482 , 487 , 534 , 0 , CIE , PUB , 2 MeV electron irradiation effects on bulk and interface of atomic layer deposited high-k gate dielectrics on silicon , THIN SOLID FILMS , Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Campabadal, F.; Rafi, J. M.; Zabala, M.; Beldarrain, O.; Ohyama, H.; Takakura, K.; Tsunoda, I. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3802 , ARE , 2013-01-14 , REC , 0 , 0 , 113 , 0 , CIE , PUB , Experimental verification of intermediate band formation on titanium-implanted silicon , JOURNAL OF APPLIED PHYSICS , Castan, H.; Perez, E.; Garcia, H.; Duenas, S.; Bailon, L.; Olea, J.; Pastor, D.; Garcia-Hemme, E.; Irigoyen, M.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3805 , ARE , 2013-01-01 , REC , 65 , 74 , 79 , 0 , CIE , PUB , 2 MeV electron irradiation effects on the electrical characteristics of metal-oxide-silicon capacitors with atomic layer deposited Al2O 3, HfO2 and nanolaminated dielectrics , SOLID-STATE ELECTRONICS , Rafi, J. M.; Campabadal, F.; Ohyama, H.; Takakura, K.; Tsunoda, I.; Zabala, M.; Beldarrain, O.; Gonzalez, M. B.; Garcia, H.; Castan, H.; Gomez, A.; Duenas, S. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6954 , ARE , 2013-01-01 , REC , 313 , 316 , 0 , 0 , CIE , PUB , Deep level defects on mono-like and polycrystalline silicon solar cells , PROCEEDINGS OF THE 2013 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE 2013) , Perez, E.; Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Moralejo, B.; Martinez, O.; Jimenez, J.; Parra, V. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3804 , ARE , 2013-01-01 , REC , 0 , 0 , 31 , 0 , CIE , PUB , Electrical characterization of atomic-layer-deposited hafnium oxide films from hafnium tetrakis(dimethylamide) and water/ozone: Effects of growth temperature, oxygen source, and postdeposition annealing , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A , Garcia, Hector; Castan, Helena; Duenas, Salvador; Bailon, Luis; Campabadal, Francesca; Beldarrain, Oihane; Zabala, Miguel; Bargallo Gonzalez, Mireia; Marc Rafi, Joan , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6963 , ARE , 2013-01-01 , REC , 285 , 288 , 0 , 0 , CIE , PUB , Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes , PROCEEDINGS OF THE 2013 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE 2013) , Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Feijoo, P. C.; Pampillon, M. A.; San Andres, E. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3803 , ARE , 2013-01-01 , REC , 0 , 0 , 31 , 0 , CIE , PUB , Interface quality of Sc2O3 and Gd2O 3 films based metal-insulator-silicon structures using Al, Pt, and Ti gates: Effect of buffer layers and scavenging electrodes , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Gomez, Alfonso; Castan, Helena; Garcia, Hector; Duenas, Salvador; Bailon, Luis; Angela Pampillon, Maria; Carlos Feijoo, Pedro; San Andres, Enrique , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6952 , ARE , 2013-01-01 , REC , 349 , 352 , 0 , 0 , CIE , PUB , Photocurrent measurements for solar cells characterization , PROCEEDINGS OF THE 2013 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE 2013) , Perez, E.; Maestro, M.; Garcia, H.; Castan, H.; Duenas, S.; Bailon, L. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6953 , ARE , 2013-01-01 , REC , 301 , 304 , 0 , 0 , CIE , PUB , The role of defects in solar cells: Control and detection Defects in solar cells , PROCEEDINGS OF THE 2013 SPANISH CONFERENCE ON ELECTRON DEVICES (CDE 2013) , Duenas, Salvador; Perez, E.; Castan, H.; Garcia, H.; Bailon, L. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6961 , ARE , 2012-01-01 , REC , 189 , 192 , 1496 , 0 , CIE , PUB , Electrical Properties of Intermediate Band (IB) Silicon Solar Cells Obtained by Titanium Ion Implantation , ION IMPLANTATION TECHNOLOGY 2012 , Castan, Helena; Perez, Eduardo; Garcia, Hector; Duenas, Salvador; Bailon, Luis; Olea, Javier; Pastor, David; Garcia-Hemme, Eric; Irigoyen, Maite; Gonzalez-Diaz, German , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3806 , ARE , 2011-01-31 , REC , 2268 , 2272 , 519 , 0 , CIE , PUB , Electrical characterization of high-pressure reactive sputtered ScO x films on silicon , THIN SOLID FILMS , Castan, H.; Duenas, S.; Gomez, A.; Garcia, H.; Bailon, L.; Feijoo, P. C.; Toledano-Luque, M.; del Prado, A.; San Andres, E.; Lucia, M. L. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3808 , ARE , 2011-01-01 , COP , 0 , 0 , 29 , 0 , CIE , PUB , Electrical characteristics of metal-insulator-semiconductor structures with atomic layer deposited Al2 O3, HfO2, and nanolaminates on different silicon substrates , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Campabadal, F.; Rafi, J. M.; Zabala, M.; Beldarrain, O.; Faigon, A.; Castan, H.; Gomez, A.; Garcia, H.; Duenas, S. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3807 , ARE , 2011-01-01 , COP , 0 , 0 , 29 , 0 , CIE , PUB , Electrical characterization of high-k based metal-insulator-semiconductor structures with negative resistance effect when using Al2O 3 and nanolaminated films deposited on p-Si , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Gomez, A.; Castan, H.; Garcia, H.; Duenas, S.; Bailon, L.; Campabadal, F.; Rafi, J. M.; Zabala, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6962 , ARE , 2011-01-01 , REC , 349 , 359 , 41 , 0 , CIE , PUB , Electron Irradiation Effects on Atomic Layer Deposited High-k Gate Dielectrics , PHYSICS AND TECHNOLOGY OF HIGH-K MATERIALS 9 , Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Campabadal, F.; Rafi, J. M.; Zabala, M.; Beldarrain, O.; Ohyama, H.; Takakura, K.; Tsunoda, I. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3809 , ARE , 2011-01-01 , COP , 0 , 0 , 29 , 0 , CIE , PUB , Influence of precursor chemistry and growth temperature on the electrical properties of SrTiO3 -based metal-insulator-metal capacitors grown by atomic layer deposition , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Garcia, H.; Castan, H.; Gomez, A.; Duenas, S.; Bailon, L.; Kukli, K.; Kariniemi, M.; Kemell, M.; Niinisto, J.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE25898 , ARE , 2011-01-01 , REC , 62 , 63 , 0 , 11 , CIE , PUB , Palabras de hielo , Alkaid: revista multitemática , Castan Lanaspa, Helena , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE23697 , ARE , 2011-01-01 , REC , 33 , 35 , 0 , 13 , CIE , PUB , Steve Jobs y la tecnología emocional , Alkaid: revista multitemática , Dueñas Carazo, Salvador; Castan Lanaspa, Helena , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3810 , ARE , 2010-06-01 , REC , 0 , 0 , 107 , 0 , CIE , PUB , Effect of interlayer trapping and detrapping on the determination of interface state densities on high-k dielectric stacks , JOURNAL OF APPLIED PHYSICS , Castan, H.; Duenas, S.; Garcia, H.; Gomez, A.; Bailon, L.; Toledano-Luque, M.; del Prado, A.; Martil, I.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6964 , ARE , 2010-01-01 , REC , 287 , 297 , 28 , 0 , CIE , PUB , Electrical characterization of high-pressure reactive sputtered Sc2O3 films on silicon , ADVANCED GATE STACK, SOURCE/DRAIN, AND CHANNEL ENGINEERING FOR SI-BASED CMOS 6: NEW MATERIALS, PROCESSES, AND EQUIPMENT , Castan, H.; Duenas, S.; Gomez, A.; Garcia, H.; Bailon, L.; Feijoo, P. C.; Toledano-Luque, M.; del Prado, A.; San Andres, E.; Lucia, M. L. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3811 , ARE , 2009-07-01 , REC , 1689 , 1691 , 86 , 0 , CIE , PUB , Comparison between the electrical properties of atomic layer deposited thin ZrO2 films processed from cyclopentadienyl precursors , MICROELECTRONIC ENGINEERING , Duenas, Salvador; Castan, Helena; Garcia, Hector; Gomez, Alfonso; Bailon, Luis; Kukli, Kaupo; Niinisto, Jaakko; Ritala, Mikko; Leskela, Markku , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3812 , ARE , 2009-02-19 , REC , 416 , 420 , 27 , 0 , CIE , PUB , Irradiation effect on dielectric properties of hafnium and gadolinium oxide gate dielectrics , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Garcia, H.; Duenas, S.; Castan, H.; Gomez, A.; Bailon, L.; Barquero, R.; Kukli, K.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3813 , ARE , 2009-02-17 , REC , 389 , 393 , 27 , 0 , CIE , PUB , Electrical properties of thin zirconium and hafnium oxide high-k gate dielectrics grown by atomic layer deposition from cyclopentadienyl and ozone precursors , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Duenas, S.; Castan, H.; Garcia, H.; Gomez, A.; Bailon, L.; Kukli, K.; Niinisto, J.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3814 , ARE , 2008-11-25 , REC , 0 , 0 , 104 , 0 , CIE , PUB , Influence of interlayer trapping and detrapping mechanisms on the electrical characterization of hafnium oxide/silicon nitride stacks on silicon , JOURNAL OF APPLIED PHYSICS , Garcia, H.; Duenas, S.; Castan, H.; Gomez, A.; Bailon, L.; Toledano-Luque, M.; del Prado, A.; Martil, I.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3815 , ARE , 2008-10-01 , REC , 0 , 0 , 155 , 0 , CIE , PUB , Comparative study of flatband voltage transients on high-k dielectric-based metal-insulator-semiconductor capacitors , JOURNAL OF THE ELECTROCHEMICAL SOCIETY , Duenas, S.; Castan, H.; Garcia, H.; Gomez, A.; Bailon, L.; Kukli, K.; Aarik, J.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3817 , ARE , 2008-01-15 , REC , 393 , 398 , 354 , 0 , CIE , PUB , Identification of spatial localization and energetic position of electrically active defects in amorphous high-k dielectrics for advanced devices , JOURNAL OF NON-CRYSTALLINE SOLIDS , Garcia, H.; Duenas, S.; Castan, H.; Bailon, L.; Kukli, K.; Aarik, J.; Ritala, M.; Leskelae, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3816 , ARE , 2008-01-15 , REC , 404 , 408 , 354 , 0 , CIE , PUB , Selection of post-growth treatment parameters for atomic layer deposition of structurally disordered TiO2 thin films , JOURNAL OF NON-CRYSTALLINE SOLIDS , Duenas, S.; Castan, H.; Garcia, H.; Bailon, L.; Kukli, K.; Lu, J.; Ritala, M.; Leskelae, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11944 , ARE , 2007-12-01 , REC , 169 , 174 , 996 , 0 , CIE , PUB , Electrical characterization of high-k dielectrics by means of flat-band voltage transient recording , SILICON FRONT-END JUNCTION FORMATION-PHYSICS AND TECHNOLOGY , Duenas S.; Castan H.; Garcia H.; Bailon L.; Kukli K.; Ritala M.; Leskela M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3818 , ARE , 2007-12-01 , REC , 1344 , 1351 , 22 , 0 , CIE , PUB , Electrical properties of high-pressure reactive sputtered thin hafnium oxide high-k gate dielectrics , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Duenas, S.; Castan, H.; Garcia, H.; Gomez, A.; Bailon, L.; Toledano-Luque, M.; Martil, I.; Gonzalez-Diaz, G. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11945 , ARE , 2007-12-01 , REC , 133 , 138 , 996 , 0 , CIE , PUB , Study of atomic layer deposited gadolinium oxide thin films on silicon , SILICON FRONT-END JUNCTION FORMATION-PHYSICS AND TECHNOLOGY , Dueñias S.; Castan H.; Garcia H.; Gomez A.; Ballon L.; Kukli K.; Hantapaa T.; Lu J.; Ritala M.; Leskela M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3819 , ARE , 2007-08-31 , REC , 0 , 0 , 154 , 0 , CIE , PUB , Electrical properties of atomic-layer-deposited thin gadolinium oxide high- k gate dielectrics , JOURNAL OF THE ELECTROCHEMICAL SOCIETY , Duenas, S.; Castan, H.; Garcia, H.; Gomez, A.; Bailon, L.; Kukli, K.; Hatanpaeae, T.; Lu, J.; Ritala, M.; Leskelae, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3820 , ARE , 2007-04-01 , REC , 653 , 656 , 47 , 0 , CIE , PUB , Experimental observations of temperature-dependent flat band voltage transients on high-k dielectrics , MICROELECTRONICS RELIABILITY , Duenas, S.; Castan, H.; Garcia, H.; Bailon, L.; Kukli, K.; Hatanpaa, T.; Ritala, M.; Leskela, M. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3821 , ARE , 2006-11-23 , REC , 0 , 0 , 100 , 0 , CIE , PUB , Experimental investigation of the electrical properties of atomic layer deposited hafnium-rich silicate films on n-type silicon , JOURNAL OF APPLIED PHYSICS , Duenas, S.; Castan, H.; Garcia, H.; Bailon, L.; Kukli, K.; Ritala, M.; Leskela, M.; Rooth, M.; Wilhelmsson, O.; Harsta, A. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3822 , ARE , 2006-03-01 , REC , 0 , 0 , 99 , 0 , CIE , PUB , Influence of single and double deposition temperatures on the interface quality of atomic layer deposited Al2O3 dielectric thin films on silicon , JOURNAL OF APPLIED PHYSICS , Duenas, S; Castan, H; Garcia, H; de Castro, A; Bailon, L; Kukli, K; Aidla, A; Aarik, J; Mandar, H; Uustare, T; Lu, J; Harsta, A , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3823 , ARE , 2005-10-01 , REC , 1044 , 1051 , 20 , 0 , CIE , PUB , A comparative study of the electrical properties of TiO2 films grown by high-pressure reactive sputtering and atomic layer deposition , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Duenas, S; Castan, H; Garcia, H; San Andres, E; Toledano-Luque, M; Martil, I; Gonzalez-Diaz, G; Kukli, K; Uustare, T; Aarik, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3824 , ARE , 2005-05-01 , COP , 949 , 952 , 45 , 0 , CIE , PUB , Electrical characterization of hafnium oxide and hafnium-rich silicate films grown by atomic layer deposition , MICROELECTRONICS RELIABILITY , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Aarik, J; Ritala, M; Leskela, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3825 , ARE , 2005-03-01 , REC , 222 , 229 , 474 , 0 , CIE , PUB , Comparative study on electrical properties of atomic layer deposited high-permittivity materials on silicon substrates , THIN SOLID FILMS , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Ritala, M; Leskela, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3826 , ARE , 2004-09-01 , REC , 1141 , 1148 , 19 , 0 , CIE , PUB , The electrical-interface quality of as-grown atomic-layer-deposited disordered HfO2 on p- and n-type silicon , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Aarik, J; Aidla, A , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3827 , ARE , 2004-08-01 , REC , 1365 , 1372 , 96 , 0 , CIE , PUB , Effect of growth temperature and postmetallization annealing on the interface and dielectric quality of atomic layer deposited HfO2 on p and n silicon , JOURNAL OF APPLIED PHYSICS , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Aarik, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6956 , ARE , 2004-01-01 , REC , 83 , 87 , 786 , 0 , CIE , PUB , Conductance transient comparative analysis of ECR-PECVD deposited SiNx,SiO2/SiNx and SiOxN gamma dielectric films on silicon substrates , FUNDAMENTALS OF NOVEL OXIDE/SEMICONDUCTOR INTERFACES , Castan, H; Duenas, S; Barbolla, J; Del Prado, A; Andres, ES; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3828 , ARE , 2004-01-01 , REC , 66 , 70 , 43 , 0 , CIE , PUB , Conductance Transient Comparative Analysis of Electron-Cyclotron Resonance Plasma-Enhanced Chemical Vapor Deposited SiNx, SiC 2/SiNx and SiOxNy Dielectric Films on Silicon Substrates , JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS , Castan, H; Duenas, S; Barbolla, J; Del Prado, A; Andres, ES; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6960 , ARE , 2004-01-01 , REC , 147 , 152 , 786 , 0 , CIE , PUB , On the interface quality of MIS structures fabricated from atomic layer deposition of HfO2,Ta2O5 and Nb2O5-Ta2O5-Nb2O5 dielectric thin films , FUNDAMENTALS OF NOVEL OXIDE/SEMICONDUCTOR INTERFACES , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Ritala, M; Leskela, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3829 , ARE , 2003-10-01 , COP , 1623 , 1629 , 47 , 0 , CIE , PUB , Conductance transient, capacitance-voltage and deep-level transient spectroscopy characterization of atomic layer deposited hafnium and zirconium oxide thin films , SOLID-STATE ELECTRONICS , Duenas, S; Castan, H; Barbolla, J; Kukli, K; Ritala, M; Leskela, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3830 , ARE , 2003-08-01 , REC , 4978 , 4981 , 42 , 0 , CIE , PUB , Interfacial State Density and Conductance-Transient Three-Dimensional Profiling of Disordered-Induced Gap States on Metal Insulator Semiconductor Capacitors Fabricated from Electron Cyclotron Resonance Plasma-Enhanced Chemical Vapor Deposited SiOxNyHz Films , JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS , Castan, H; Duenas, S; Barbolla, J; Del Prado, A; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3832 , ARE , 2003-05-01 , REC , 375 , 378 , 14 , 0 , CIE , PUB , A comparative study of anodic tantalum pentoxide and high-pressure sputtered titanium oxide , JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , Duenas, S; Castan, H; Barbolla, J; San Andres, E; Del Prado, A; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3831 , ARE , 2003-05-01 , REC , 287 , 290 , 14 , 0 , CIE , PUB , Electrical characterization of MIS capacitors fabricated from ECR-PECVD silicon oxide and silicon nitride bilayer films , JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , Castan, H; Duenas, S; Barbolla, J; San Andres, E; Del Prado, A; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3833 , ARE , 2002-11-01 , LET , 0 , 0 , 41 , 0 , CIE , PUB , Experimental verification of direct tunneling assisted electron capture of disordered-induced gap states in metal-insulator-semiconductor structures , Japanese Journal of Applied Physics, Part 2: Letters , Castan H.; Dueñas S.; Barbolla J. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3834 , ARE , 2001-08-01 , REC , 1441 , 1450 , 45 , 0 , CIE , PUB , Tantalum pentoxide obtained from TaNx and TaSi2 anodisation: An inexpensive and thermally stable high k dielectric , SOLID-STATE ELECTRONICS , Duenas, S; Castan, E; Barbolla, J; Kola, RR; Sullivan, PA , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3835 , ARE , 2001-07-01 , REC , 4479 , 4484 , 40 , 0 , CIE , PUB , Electrical characterization of Al/SiNx:H/n and p-In0.53Ga0.47As structures by deep-level transient spectroscopy and conductance transient techniques , JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS , Castan, H; Duenas, S; Barbolla, J; Blanco, N; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3837 , ARE , 2001-04-01 , REC , 263 , 267 , 12 , 0 , CIE , PUB , C-V, DLTS and conductance transient characterization of SiNx: H/InP interface improved by N2 remote plasma cleaning of the InP surface , JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , Castan, H; Duenas, S; Barbolla, J; Redondo, E; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3836 , ARE , 2001-04-01 , REC , 317 , 321 , 12 , 0 , CIE , PUB , DLTS and conductance transient investigation on defects in anodic tantalum pentoxide thin films , JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , Duenas, S; Castan, H; Barbolla, J; Kola, RR; Sullivan, PA , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE11946 , ARE , 2001-01-01 , REC , 186 , 191 , 19 , 0 , CIE , PUB , Influence of electron cyclotron resonance nitrogen plasma exposure on the electrical characteristics of SiNx:H/InP structures , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B , Redondo, E; Martil, I; Gonzalez-Diaz, G; Castan, H; Duenas, S , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3838 , ARE , 2000-12-01 , REC , 845 , 848 , 40 , 0 , CIE , PUB , Interface quality study of ECR-deposited and rapid thermal annealed silicon nitride A1/SiNx:H/InP and A1/SiNx:H/ in0.53Ga0.47As structures by DLTS and conductance transient techniques , MICROELECTRONICS RELIABILITY , Castan, H; Duenas, S; Barbolla, J; Redondo, E; Blanco, N; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3839 , ARE , 2000-11-01 , REC , 6212 , 6215 , 39 , 0 , CIE , PUB , Electrical characterization of low nitrogen content plasma deposited and rapid thermal annealed Al/SiNx:H/InP metal-insulator-semiconductor structures , JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS , Castan, H; Duenas, S; Barbolla, J; Redondo, E; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3840 , ARE , 1999-12-01 , REC , 659 , 662 , 40 , 0 , CIE , PUB , Electrical characteristics of anodic tantalum pentoxide thin films under thermal stress , MICROELECTRONICS RELIABILITY , Duenas, S; Castan, H; Barbolla, J; Kola, RR; Sullivan, PA , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3842 , ARE , 1999-12-01 , REC , 6924 , 6930 , 86 , 0 , CIE , PUB , Electrical characterization of electron cyclotron resonance deposited silicon nitride dual layer for enhanced AI/SiNx:H/InP metal-insulator-semiconductor structures fabrication , JOURNAL OF APPLIED PHYSICS , Pelaez, R; Castan, E; Duenas, S; Barbolla, J; Redondo, E; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3841 , ARE , 1999-12-01 , COP , 2178 , 2182 , 17 , 0 , CIE , PUB , Thermally induced improvements on SiNx:H/lnP devices , JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS , Redondo, E; Blanco, N; Martil, I; Gonzalez-Diaz, G; Pelaez, R; Deunas, S; Castan, H , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3843 , ARE , 1999-11-01 , REC , 4855 , 4860 , 86 , 0 , CIE , PUB , Electrical characterization of He-ion implantation-induced deep levels in p+n InP junctions , JOURNAL OF APPLIED PHYSICS , Quintanilla, L; Pinacho, R; Enriquez, L; Pelaez, R; Duenas, S; Castan, E; Bailon, L; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3844 , ARE , 1999-06-01 , REC , 7978 , 7980 , 85 , 0 , CIE , PUB , Electrical characterization of a He ion implantation-induced deep level existing in p+n InP junctions , JOURNAL OF APPLIED PHYSICS , Quintanilla, L; Pinacho, R; Enriquez, L; Pelaez, R; Duenas, S; Castan, E; Bailon, L; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3846 , ARE , 1999-01-01 , REC , 413 , 418 , 10 , 0 , CIE , PUB , Electrical characterization of deep levels existing in fully implanted and rapid thermal annealed p+n InP junctions , JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , Quintanilla, L; Duenas, S; Castan, E; Pinacho, R; Pelaez, R; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3847 , ARE , 1999-01-01 , REC , 373 , 377 , 10 , 0 , CIE , PUB , Electrical characterization of ECR enhaced deposited silicon nitride bilayers for high quality Al/SiNx/InP MIS structure fabrication , JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , Duenas, S; Pelaez, R; Castan, E; Pinacho, R; Quintanilla, L; Barbolla, J; Martil, I; Redondo, E; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3845 , ARE , 1999-01-01 , REC , 379 , 384 , 10 , 0 , CIE , PUB , Use of anodic tantalum pentoxide for high-density capacitor fabrication , JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , Duenas, S; Castan, E; Barbolla, J; Kola, RR; Sullivan, PA , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3848 , ARE , 1998-04-01 , REC , 389 , 393 , 13 , 0 , CIE , PUB , Electrical characterization of deep levels existing in Mg-Si- and Mg-P-Si-implanted p+n InP junctions , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , Quintanilla, L; Duenas, S; Castan, E; Pinacho, R; Pelaez, R; Barbolla, J; Martin, JM; Gonzalez-Diaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3850 , ARE , 1998-01-01 , REC , 332 , 338 , 83 , 0 , CIE , PUB , Deposition of SiNx: H thin films by the electron cyclotron resonance and its application to Al/SiNx:H/Si structures , JOURNAL OF APPLIED PHYSICS , Garcia, S; Martil, I; Diaz, GG; Castan, E; Duenas, S; Fernandez, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3849 , ARE , 1998-01-01 , REC , 600 , 603 , 83 , 0 , CIE , PUB , Good quality Al/SiNx:H/InP metal-insulator-semiconductor devices obtained with electron cyclotron resonance plasma method , JOURNAL OF APPLIED PHYSICS , Garcia, S; Martil, I; Diaz, GG; Castan, E; Duenas, S; Fernandez, M , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3851 , ARE , 1997-11-01 , REC , 4338 , 4345 , 82 , 0 , CIE , PUB , Detailed electrical characterization of DX centers in Se-doped AlxGa1-xAs , JOURNAL OF APPLIED PHYSICS , Duenas, S; Pinacho, R; Castan, E; Quintanilla, L; Pelaez, R; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3852 , ARE , 1997-08-11 , REC , 826 , 828 , 71 , 0 , CIE , PUB , Experimental observation of conductance transients in Al/SiNx:H/Si metal-insulator-semiconductor structures , APPLIED PHYSICS LETTERS , Duenas, S; Pelaez, R; Castan, E; Pinacho, R; Quintanilla, L; Barbolla, J; Martil, I; GonzalezDiaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3853 , ARE , 1997-04-01 , REC , 3143 , 3150 , 81 , 0 , CIE , PUB , Deep levels in p+-n junctions fabricated by rapid thermal annealing of Mg or Mg/P implanted InP , JOURNAL OF APPLIED PHYSICS , Quintanilla, L; Duenas, S; Castan, E; Pinacho, R; Barbolla, J; Martin, JM; GonzalezDiaz, G , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3854 , ARE , 1997-01-01 , REC , 103 , 109 , 41 , 0 , CIE , PUB , Thermal emission processes of DX centres in AlxGa1-xAs:Si , SOLID-STATE ELECTRONICS , Enriquez, L; Duenas, S; Castan, E; Quintanilla, L; Pinacho, R; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3855 , ARE , 1996-01-01 , REC , 310 , 315 , 79 , 0 , CIE , PUB , Dopant level freeze-out and nonideal effects in 6H-SiC epilayer junctions , JOURNAL OF APPLIED PHYSICS , Quintanila, L; Duenas, S; Castan, E; Pinacho, R; Pelaz, L; Bailon, L; Barbolla, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3856 , ARE , 1995-12-01 , REC , 5325 , 5330 , 78 , 0 , CIE , PUB , Deep-level transient spectroscopy and electrical characterization of ion-implanted p-n junctions into undoped InP , JOURNAL OF APPLIED PHYSICS , MARTIN, JM; GARCIA, S; MARTIL, I; GONZALEZDIAZ, G; CASTAN, E; DUENAS, S , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE12031 , ARE , 1995-10-01 , REC , 1074 , 1078 , 11 , 0 , CIE , PUB , Ability of capacitance¿voltage transient technique to study spatial distribution and electric field dependence of emission properties of deep levels in semiconductors , MATERIALS SCIENCE AND TECHNOLOGY , Duenas, S; Castan, E; Quintanilla, L; Enriquez, L; Barbolla, J; LoraTamayo, E; Montserrat, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3857 , ARE , 1994-12-01 , REC , 1637 , 1648 , 9 , 0 , CIE , PUB , Characterization of the damage induced in boron-implanted and RTA annealed silicon by the capacitance-voltage transient technique , SEMICONDUCTOR SCIENCE AND TECHNOLOGY , DUENAS, S; CASTAN, E; ENRIQUEZ, L; BARBOLLA, J; MONTSERRAT, J; LORATAMAYO, E , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3858 , ARE , 1993-01-01 , REC , 1362 , 1366 , 80-81 , 0 , CIE , PUB , Electrical characterization of MOS structures fabricated on SF6 and SF6 + C2CIF5 reactive ion etched silicon , NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS , Castan E.; Vicente J.; Barbolla J.; Cabruja E.; Lora-Tamayo E. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3859 , ARE , 1992-12-01 , REC , 2710 , 2716 , 71 , 0 , CIE , PUB , A study of metal-oxide-semiconductor capacitors fabricated on SF 6 and SF6+Cl2 reactive-ion-etched Si , JOURNAL OF APPLIED PHYSICS , Castan E.; Arias J.; Barbolla J.; Cabruja E.; Lora-Tamayo E. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6951 , ARE , 1992-07-15 , REC , 525 , 530 , 72 , 0 , CIE , PUB , INFLUENCE OF REFILLING EFFECTS ON DEEP-LEVEL TRANSIENT SPECTROSCOPY MEASUREMENTS IN SE-DOPED ALXGA1-XAS , JOURNAL OF APPLIED PHYSICS , ENRIQUEZ, L; DUENAS, S; BARBOLLA, J; IZPURA, I; MUNOZ, E , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6949 , ARE , 1992-03-01 , REC , 285 , 297 , 35 , 0 , CIE , PUB , ADMITTANCE SPECTROSCOPY IN JUNCTIONS , SOLID-STATE ELECTRONICS , BARBOLLA, J; DUENAS, S; BAILON, L , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6955 , ARE , 1991-04-15 , REC , 4300 , 4305 , 69 , 0 , CIE , PUB , CHARACTERIZATION OF THE DX CENTERS IN ALGAAS-SI BY ADMITTANCE SPECTROSCOPY , JOURNAL OF APPLIED PHYSICS , DUENAS, S; IZPURA, I; ARIAS, J; ENRIQUEZ, L; BARBOLLA, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3860 , ARE , 1990-12-01 , REC , 6309 , 6314 , 67 , 0 , CIE , PUB , Characterization of the EL2 center in GaAs by optical admittance spectroscopy , JOURNAL OF APPLIED PHYSICS , DUENAS, S; CASTAN, E; DEDIOS, A; BAILON, L; BARBOLLA, J; PEREZ, A , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3861 , ARE , 1990-01-01 , REC , 987 , 992 , 33 , 0 , CIE , PUB , Interface state density measurement in MOS structures by analysis of the thermally stimulated conductance , SOLID-STATE ELECTRONICS , de Dios A.; Castan E.; Bailon L.; Barbolla J.; Lozano M.; Lora-Tamayo E. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE3862 , ARE , 1990-01-01 , REC , 1419 , 1423 , 33 , 0 , CIE , PUB , Rie-induced damage in MOS structures , SOLID-STATE ELECTRONICS , de Dios A.; Castan E.; Bailon L.; Barbolla J.; Lozano M.; Lora-Tamayo E. , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6950 , ARE , 1989-04-01 , REC , 287 , 293 , 32 , 0 , CIE , PUB , CONSTANT-CAPACITANCE DEEP-LEVEL OPTICAL SPECTROSCOPY , SOLID-STATE ELECTRONICS , VILANOVA, J; DUENAS, S; RUBIO, E; BAILON, L; BARBOLLA, J; LORATAMAYO, E , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6959 , ARE , 1987-04-01 , REC , 2541 , 2545 , 61 , 0 , CIE , PUB , OPTICAL ADMITTANCE SPECTROSCOPY - A NEW METHOD FOR DEEP LEVEL CHARACTERIZATION , JOURNAL OF APPLIED PHYSICS , DUENAS, S; JARAIZ, M; VICENTE, J; RUBIO, E; BAILON, L; BARBOLLA, J , S ) ) ) , PublicacionArticuloRevista ( PublicacionArticuloRevistaComun ( Publicacion ( ARE6957 , ARE , 1986-09-01 , REC , 883 , 884 , 29 , 0 , CIE , PUB , ELECTRON THERMAL EMISSION RATES OF NICKEL CENTERS IN SILICON , SOLID-STATE ELECTRONICS , JARAIZ, M; 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M.; Zabala, M.; Beldarrain, O.; Ohyama, H.; Takakura, K.; Tsunoda, I. , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1860 , CAP , null , , 83 , 87 , , , , , Conductance transient comparative analysis of ECR-PECVD deposited SiNx,SiO2/SiNx and SiOxN gamma dielectric films on silicon substrates , , Castan, H; Duenas, S; Barbolla, J; Del Prado, A; Andres, ES; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1863 , CAP , null , , 147 , 152 , , , , , On the interface quality of MIS structures fabricated from atomic layer deposition of HfO2,Ta2O5 and Nb2O5-Ta2O5-Nb2O5 dielectric thin films , , Duenas, S; Castan, H; Garcia, H; Barbolla, J; Kukli, K; Ritala, M; Leskela, M , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1862 , CAP , null , , 231 , 236 , , , , , Conductance-transient three-dimensional profiling of disordered induced gap states on metal-insulator-semiconductor structures , , Castan, H; Duenas, S; Barbolla, J; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1855 , CAP , null , , 185 , 190 , , , , , Radio-frequency impedance analysis of anodic tantalum pentoxide thin films , , Duenas, S; Castan, H; Barbolla, J; Kola, RR; Sullivan, PA , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1856 , CAP , null , , 371 , 378 , , , , , Fabrication of Ta2O5 thin films by anodic oxidation of tantalum nitride and tantalum silicide: Growing mechanisms, electrical characterization and ULSI M-I-M capacitor performances , , Duenas, S; Castan, H; Barbolla, J; Kola, RR; Sullivan, PA , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP1861 , CAP , null , , 87 , 92 , , , , , Conductance transients study of slow traps in Al/SiNx : H/Si and Al/SiNx : H/InP metal-insulator-semiconductor structures , , Duenas, S; Pelaez, R; Castan, E; Barbolla, J; Martil, I; Gonzalez-Diaz, G , S ) ) ) , PublicacionCapituloLibro ( PublicacionCapituloLibroComun ( Publicacion ( CAP6215 , CAP , null , , 93 , 98 , , , , , Variación con la temperatura de la posición interfacial del nivel de Fermi en una estructura MOS: estudio por simulación , , Dios Hernandez, Agustin de; Orantes de la Fuente, Jose Luis; Castan Lanaspa, Helena; Bailon Vega, Luis A.; Barbolla Sancho, Juan , S ) ) ) ][][ PublicacionLibro ( PublicacionLibroComun ( Publicacion ( LLI100924 , LLI , 2006-01-01 , , , , , , , , New Materials and Processes for Incoming Semiconudors Technologies , , DUEÑAS CARAZO, S.; CASTAN LANASPA, M.; , S ) ) ) , PublicacionLibro ( PublicacionLibroComun ( Publicacion ( LLI107779 , LLI , 1995-01-01 , , , , , , , , Caracterización en estructuras MOS del dañado eléctrico generado por procesos de Grabado Iónico Reactivo , , Castan Lanaspa, Helena , S ) ) ) ][][][][ OtraAyudaBeca ( Actividad: ( AAB60392 , AAB , null , null , 2019-01-01 , , , , CONTRATO PREDOC UVA DE ÓSCAR GONZÁLEZ OSSORIO: CARACTERIZACIÓN ELÉCTRICA DE ESTRUCTURAS MIS Y MIM CON DIELÉCTRICOS DE ALTA PERMITIVIDAD PARA SU APLICACIÓN EN RRAMS Y MEMRISTORES , , S , ) ) , OtraAyudaBeca ( Actividad: ( AAB60718 , AAB , null , null , 2018-05-01 , , , , CONTRATO GARANTÍA JUVENIL JCYL TIPO B DE LUIS ANTONIO DOMÍNGUEZ LÓPEZ: APOYO EN LAS TAREAS DE INVESTIGACIÓN DEL GRUPO DE CARACTERIZACIÓN DE MATERIALES Y DISPOSITIVOS ELECTRÓNICOS , , S , ) ) ][ OtraAyudaBeca ( Actividad: ( AAB60392 , AAB , null , null , 2019-01-01 , , , , CONTRATO PREDOC UVA DE ÓSCAR GONZÁLEZ OSSORIO: CARACTERIZACIÓN ELÉCTRICA DE ESTRUCTURAS MIS Y MIM CON DIELÉCTRICOS DE ALTA PERMITIVIDAD PARA SU APLICACIÓN EN RRAMS Y MEMRISTORES , , S , ) ) , OtraAyudaBeca ( Actividad: ( AAB60718 , AAB , null , null , 2018-05-01 , , , , CONTRATO GARANTÍA JUVENIL JCYL TIPO B DE LUIS ANTONIO DOMÍNGUEZ LÓPEZ: APOYO EN LAS TAREAS DE INVESTIGACIÓN DEL GRUPO DE CARACTERIZACIÓN DE MATERIALES Y DISPOSITIVOS ELECTRÓNICOS , , S , ) ) ][][][ Tesis ( TES247 , 100 , null , SC , 58015811 , Universidad de Valladolid , , S , ) , Tesis ( TES2145639706 , 100 , 2017-10-27 , SC , 58015811 , Universidad de Valladolid , A DEPENDABILITY MINDED APPROACH TO VIDEO RECORDING BY MEANS OF VIRTUALIZATION , S , ) , Tesis ( TES2145637285 , 100 , 2014-11-19 , SC , 58015811 , Universidad de Valladolid , CARACTERIZACIÓN DE DEFECTOS EN MATERIALES SEMICONDUCTORES. 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PUBLICACIONES

Artículos de revista (119)

Kalam K.; Seemen H.; Mikkor M.; Jõgiaas T.; Ritslaid P.; Tamm A.; Kukli K.; Kasikov A.; Link J.; Stern R.; Dueñas S.; Castan H. Electrical and magnetic properties of atomic layer deposited cobalt oxide and zirconium oxide nanolaminates. THIN SOLID FILMS 2019; 669: 294-300.
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Garcia, H.; Gonzalez, M. B.; Mallol, M. M.; Castan, H.; Duenas, S.; Campabadal, F.; Acero, M. C.; Sambuco Salomone, L.; Faigon, A. Electrical Characterization of Defects Created by gamma-Radiation in HfO2-Based MIS Structures for RRAM Applications. JOURNAL OF ELECTRONIC MATERIALS 2018; 47(9): 5013-5018.
Enlace a la publicación
Garcia, H.; Castan, H.; Duenas, S.; Garcia-Hemme, E.; Garcia-Hernansaz, R.; Montero, D.; Gonzalez-Diaz, G. Energy Levels of Defects Created in Silicon Supersaturated with Transition Metals. JOURNAL OF ELECTRONIC MATERIALS 2018; 47(9): 4993-4997.
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Kalam, Kristjan; Seemen, Helina; Mikkor, Mats; Ritslaid, Peeter; Stern, Raivo; Duenas, Salvador; Castan, Helena; Tamm, Aile; Kukli, Kaupo. Electric and Magnetic Properties of Atomic Layer Deposited ZrO2-HfO2 Thin Films. ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY 2018; 7(9).
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Seemen, Helina; Rahn, Mihkel; Kalam, Kristjan; Sajavaara, Timo; Duenas, Salvador; Castan, Helena; Link, Joosep; Stern, Raivo; Kukli, Kaupo; Tamm, Aile. Properties of Atomic Layer Deposited Nanolaminates of Zirconium and Cobalt Oxides. ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY 2018; 7(8).
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Libros (2)

DUEÑAS CARAZO, S., CASTAN LANASPA, M. (2006). New Materials and Processes for Incoming Semiconudors Technologies. Transworld Research Network.
Castan Lanaspa Helena. (1995). Caracterización en estructuras MOS del dañado eléctrico generado por procesos de Grabado Iónico Reactivo. .
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Capítulos de libros (12)

Perez, E.; Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Moralejo, B.; Martinez, O.; Jimenez, J.; Parra, V. Deep level defects on mono-like and polycrystalline silicon solar cells. En: 2013. p. 313-316.

Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Feijoo, P. C.; Pampillon, M. A.; San Andres, E. Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes. En: 2013. p. 285-288.

Perez, E.; Maestro, M.; Garcia, H.; Castan, H.; Duenas, S.; Bailon, L. Photocurrent measurements for solar cells characterization. En: 2013. p. 349-352.

Duenas, Salvador; Perez, E.; Castan, H.; Garcia, H.; Bailon, L. The role of defects in solar cells: Control and detection Defects in solar cells. En: 2013. p. 301-304.

Garcia, H.; Castan, H.; Duenas, S.; Bailon, L.; Campabadal, F.; Rafi, J. M.; Zabala, M.; Beldarrain, O.; Ohyama, H.; Takakura, K.; Tsunoda, I. Electron Irradiation Effects on Atomic Layer Deposited High-k Gate Dielectrics. En: 2011. p. 349-359.

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AYUDA A LA INVESTIGACIÓN

Proyectos (17)

FABRICACIÓN, CARACTERIZACIÓN, SIMULACIÓN, MODELADO Y APLICACIONES DE DISPOSITIVOS DE CONMUTACIÓN RESISTIVA.. CASTAN LANASPA, MARIA HELENA (IP); DUEÑAS CARAZO, SALVADOR (IP). TEC2017-84321-C4-2-R. MINISTERIO DE ECONOMÍA Y COMPETITIVIDAD FONDOS FEDER 2018-2020
PERSONAL GARANTÍA JUVENIL JCYL - GONZÁLEZ OSSORIO, ÓSCAR. CASTAN LANASPA, MARIA HELENA (IP). UVA-110-B. JCYL CONSEJERÍA DE EDUCACIÓN 2016-2018
CARACTERIZACIÓN ELÉCTRICA DE ESTRUCTURAS MIS Y MIM CON DIELÉCTRICOS DE ALTA PERMITIVIDAD PARA SU APLICACIÓN EN RRAMS Y MEMRISTORES. CASTAN LANASPA, MARIA HELENA (IP). TEC2014-52152-C3-3-R. MINISTERIO DE ECONOMÍA Y COMPETITIVIDAD 2015-2018
FABRICACIÓN Y CARACTERIZACIÓN DE CAPAS DE DIELÉCTRICOS DE ALTA PERMITIVIDAD DEPOSITADAS POR ALD SOBRE SISLICIO Y SOBRE GRAFENO. CASTAN LANASPA, MARIA HELENA (IP). TEC2011-27292-C02-01. MICINN. MINISTERIO DE CIENCIA E INNOVACIÓN 2012-2015
CUALIFICACIÓN DE SUSTRATOS DE SILICIO MULTICRISTALINO PARA CÉLULAS SOLARES. CASTAN LANASPA, MARIA HELENA (IP). VA128A11-2. JCYL CONSEJERÍA DE EDUCACIÓN 2011-2013
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Otras ayudas y becas (2)

CONTRATO PREDOC UVA DE ÓSCAR GONZÁLEZ OSSORIO: CARACTERIZACIÓN ELÉCTRICA DE ESTRUCTURAS MIS Y MIM CON DIELÉCTRICOS DE ALTA PERMITIVIDAD PARA SU APLICACIÓN EN RRAMS Y MEMRISTORES. CASTAN LANASPA, MARIA HELENA. 2019
CONTRATO GARANTÍA JUVENIL JCYL TIPO B DE LUIS ANTONIO DOMÍNGUEZ LÓPEZ: APOYO EN LAS TAREAS DE INVESTIGACIÓN DEL GRUPO DE CARACTERIZACIÓN DE MATERIALES Y DISPOSITIVOS ELECTRÓNICOS. CASTAN LANASPA, MARIA HELENA. 01/05/2018
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OTROS

Tesis doctorales (5)

PEREZ DIEZ, EDUARDO . UNIVERSIDAD DE VALLADOLID.
 
CABEZA RODRIGUEZ, MIGUEL ÁNGEL A DEPENDABILITY MINDED APPROACH TO VIDEO RECORDING BY MEANS OF VIRTUALIZATION. UNIVERSIDAD DE VALLADOLID; 2017.
 
PEREZ DIEZ, EDUARDO CARACTERIZACIÓN DE DEFECTOS EN MATERIALES SEMICONDUCTORES. APLICACIÓN AL ESTUDIO DE NUEVOS SUSTRATOS DE SILICIO PARA CÉLULAS SOLARES. UNIVERSIDAD DE VALLADOLID; 2014.
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GOMEZ BRAVO, ALFONSO . UNIVERSIDAD DE VALLADOLID; 2011.
 
GOMEZ BRAVO, ALFONSO CARACTERIZACIÓN DE DIELÉCTRICOS DE ALTA PERMITIVIDAD PARA SU APLICACIÓN EN TECNOLOGÍAS NANOMÉTRICAS. UNIVERSIDAD DE VALLADOLID; 2011.
 
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Congresos (48)

8th Spanish Conference on Electron Devices (CDE 11), Palma de Mallorca (España) 08/02/2011
(Póster). GOMEZ BRAVO, A.; CASTAN LANASPA, M.; GARCIA GARCIA, H.; DUEÑAS CARAZO, S.; BAILON VEGA, L.; CAMPABADALL, F.; RAFÍ, J.; ZABALA, M.; Negative-resistence effect in Al2O3 based and nanolaminated MIS structures
(Póster). CASTAN LANASPA, M.; GARCIA GARCIA, H.; GOMEZ BRAVO, A.; DUEÑAS CARAZO, S.; BAILON VEGA, L.; A study of tunneling assisted charge exchange on the inner interface of high-k dielectric stacks
(Póster). GARCIA GARCIA, H.; CASTAN LANASPA, M.; GOMEZ BRAVO, A.; DUEÑAS CARAZO, S.; BAILON VEGA, L.; KUKLI, K.; KARINIEMI, M.; KEMELL, M.; NIINISTO, J.; RITALA, M.; LESKELA, M.; Characterization of SrTiO3-based MIM capacitors grown by using different precursors and growth temperatures
16th Workshop on Dielectrics in Microelectronics, BRATISLAVA (ESLOVAQUIA) 28/06/2010
(Ponencia). CASTAN LANASPA, M.; DUEÑAS CARAZO, S.; GARCIA GARCIA, H.; GOMEZ BRAVO, A.; BAILON VEGA, L.; Deep-level transient spectroscopy on high-k dielectric stacks: Effects of the interlayer traps.
(Póster). CAMPABADALL, F.; RAFÍ, J.; ZABALA, M.; FAIGON, A.; CASTAN LANASPA, M.; GOMEZ BRAVO, A.; GARCIA GARCIA, H.; DUEÑAS CARAZO, S.; Electrical characteristics of MIS structures with ALD Al2O3 HfO2 and nanolaminates on different silicon substrates
(Ponencia). GOMEZ BRAVO, A.; CASTAN LANASPA, M.; GARCIA GARCIA, H.; DUEÑAS CARAZO, S.; BAILON VEGA, L.; CAMPABADALL, F.; RAFÍ, J.; ZABALA, M.; Electrical characterization of high-k based MIS structures with negative resistance effect in I-V characteristics.
(Póster). GARCIA GARCIA, H.; CASTAN LANASPA, M.; GOMEZ BRAVO, A.; DUEÑAS CARAZO, S.; BAILON VEGA, L.; KUKLI, K.; KARINIEMI, M.; NIINISTO, J.; RITALA, M.; LESKELA, M.; Influence of precursor chemistry and growth temperature on the electrical properties of STO-based MIM capacitors grown by atomic layer deposition.
217th Electrochemical Society Meeting, Vancouver (CANADA) 25/04/2010
(Póster). DUEÑAS CARAZO, S.; CASTAN LANASPA, M.; GARCIA GARCIA, H.; GOMEZ BRAVO, A.; BAILON VEGA, L.; KUKLI, K.; NIINISTO, J.; RITALA, M.; LESKELA, M.; Electrical characterization of high-pressure reactive sputtered Sc2O3 films on silicon.
16th Bi-annual Conference on 'Insulating Films on Semiconductors', Cambridge (U.K.) 30/06/2009
(Ponencia). DUEÑAS CARAZO, S.; CASTAN LANASPA, M.; GARCIA GARCIA, H.; GOMEZ BRAVO, A.; BAILON VEGA, L.; KUKLI, K.; NIINISTO, J.; RITALA, M.; LESKELA, M.; Comparison between the electrical properties of atomic layer deposited thin ZrO2 films processed from cyclopentadienyl precursors
Baltic Atomic layer Deposition Conference, UPPSALA (SUECIA) 15/06/2009
(Póster). DUEÑAS CARAZO, S.; CASTAN LANASPA, M.; GOMEZ BRAVO, A.; GARCIA GARCIA, H.; BAILON VEGA, L.; CAMPABADALL, F.; RAFÍ, J.; ZABALA, M.; Electrical characterization of metal insulator semiconductor structures based on atomic layer deposited high-k dielectrics.
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Estancias de investigación (1)

Encapsulado Avanzado. 01/07/1997 - 30/09/1997
     Advanced Electronic Packaging Department Bell Laboratories Lucent Technologies. Murray Hill ( ESTADOS UNIDOS DE AMÉRICA )
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