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Institute of Electrical and Electronics Engineers (IEEE ), CapitolsLlib{id=com.sigma.fs3.argos.domain.gpc.GpcCapitolsLlibPK[ifcactivitat=CAP, ifccomptador=1865]},camposKey: 285 288 Electrical study of ScO-based MIS structures using Al and Ti as gate electrodes 978-1-4673-4784-62012 International Symposium on Telecommunication Technologies (ISTT) 26-28 Nov. 2012, Kuala Lumpur, Malaysia 1 2013-01-01 Piscataway, CapitolsLlib{id=com.sigma.fs3.argos.domain.gpc.GpcCapitolsLlibPK[ifcactivitat=CAP, ifccomptador=1857]},camposKey: 349 352 Photocurrent measurements for solar cells characterization 978-1-4673-4784-62012 International Symposium on Telecommunication Technologies (ISTT) 26-28 Nov. 2012, Kuala Lumpur, Malaysia 1 2013-01-01 Piscataway, CapitolsLlib{id=com.sigma.fs3.argos.domain.gpc.GpcCapitolsLlibPK[ifcactivitat=CAP, ifccomptador=28728]},camposKey: 0 0 Photocurrent measurements for solar cells characterization 97814673466652013 Spanish Conference on Electron Devices (CDE 2013) 1 2013-01-01 Institute of Electrical and Electronics Engineers (IEEE ), CapitolsLlib{id=com.sigma.fs3.argos.domain.gpc.GpcCapitolsLlibPK[ifcactivitat=CAP, ifccomptador=1858]},camposKey: 301 304 The role of defects in solar cells: Control and detection Defects in solar cells 978-1-4673-4784-62012 International Symposium on Telecommunication Technologies (ISTT) 26-28 Nov. 2012, Kuala Lumpur, Malaysia 1 2013-01-01 Piscataway, CapitolsLlib{id=com.sigma.fs3.argos.domain.gpc.GpcCapitolsLlibPK[ifcactivitat=CAP, ifccomptador=28730]},camposKey: 91 94 Un clamor general 8461646649Espacio imagen palabra 1 2013-01-01 Instituto Núñez de Arce , CapitolsLlib{id=com.sigma.fs3.argos.domain.gpc.GpcCapitolsLlibPK[ifcactivitat=CAP, ifccomptador=21519]},camposKey: Electrical Characterization of High-K Dielectric Gates for Microelectronic Devices 9789535107644Dielectric Material 1 2012-01-01 IntechOpen, CapitolsLlib{id=com.sigma.fs3.argos.domain.gpc.GpcCapitolsLlibPK[ifcactivitat=CAP, ifccomptador=21688]},camposKey: A study of tunneling assisted charge exchange on the inner interface of high-k dielectrics s tacks 978-1-4244-7865-12011 Spanish Conference on Electron Devices Proceedings 1 2011-01-01 IEEE, CapitolsLlib{id=com.sigma.fs3.argos.domain.gpc.GpcCapitolsLlibPK[ifcactivitat=CAP, ifccomptador=21687]},camposKey: Characterization of SrTiO3-based MIM capacitors grown by using different precursors and growth temperatures 978-1-4244-7865-12011 Spanish Conference on Electron Devices Proceedings 1 2011-01-01 IEEE, CapitolsLlib{id=com.sigma.fs3.argos.domain.gpc.GpcCapitolsLlibPK[ifcactivitat=CAP, ifccomptador=1864]},camposKey: 349 359 Electron Irradiation Effects on Atomic Layer Deposited High-k Gate Dielectrics 978-1-56677-903-6- 1 2011-01-01 -, CapitolsLlib{id=com.sigma.fs3.argos.domain.gpc.GpcCapitolsLlibPK[ifcactivitat=CAP, ifccomptador=21689]},camposKey: Negative-resistance effect in Al2O3 based and nanolaminated MIS structures 978-1-4244-7865-12011 Spanish 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com.sigma.investigacion.cawdos.entities.ayudaInvestigacion.ProjectesPPC[id=com.sigma.fs3.argos.domain.gpc.ayudasrecerca.ProjectesPPCId@4134c8], com.sigma.investigacion.cawdos.entities.ayudaInvestigacion.ProjectesPPC[id=com.sigma.fs3.argos.domain.gpc.ayudasrecerca.ProjectesPPCId@4134dc]][][][][][][com.sigma.fs3.argos.domain.gpc.altres.ProjecteInnovacio@13577, com.sigma.fs3.argos.domain.gpc.altres.ProjecteInnovacio@1357a, com.sigma.fs3.argos.domain.gpc.altres.ProjecteInnovacio@13579, com.sigma.fs3.argos.domain.gpc.altres.ProjecteInnovacio@13578][CapitolsLlib{id=com.sigma.fs3.argos.domain.gpc.GpcCapitolsLlibPK[ifcactivitat=CAP, ifccomptador=25951]},camposKey: 74 77 Semiempirical Memdiode Model for Resistive Switching Devices in Dynamic Regimes 978166544452113th Spanish Conference on Electron Devices, CDE 2021 1 2021-01-01 IEEE]
